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Trinity College Dublin
Dublin 2
Ireland

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Dr. Robert Barklie

Dr. Robert Barklie

Fellow Emeritus, Physics

http://people.tcd.ie/rbarklie

Biography

Robert Barklie graduated from TCD in 1966 with a First Class Honours degree in Physics.He then moved to the Cavendish Laboratory in Cambridge University where he obtained a PhD in 1969.From 1969 to 1973 he was a Lecturer in the Physics Department at Makerere University in Uganda and from there he returned to the Cavendish Laboratory for a year as a Postdoctoral Fellow .In 1974 he was appointed a Lecturer in Physics at TCD and later a Senior Lecturer.He retired in September 2008 but continues to research and to be involved in some teaching .

Publications and Further Research Outputs

  • Defects in a-C films in, editor(s)S.R.P.Silva , Properties of Amorphous Carbon, London, INSPEC, 2003, pp93 - 102, [R.C.Barklie]Book Chapter, 2003
  • B.J.Jones,R.C.Barklie,G.Smith,H.El Mkami,J.D.Carey,S.R.P.Silva, An EPR study at X- and W- band of defects in a-C:H films in the temperature range 5 - 300 K, Diamond and Related Materials, 12, 2003, p116 - 123Journal Article, 2003
  • R.C.Barklie, Characterisation of defects in amorphous carbon by electron paramagnetic resonance, Diamond and Related Materials, 12, 2003, p1427 - 1434Journal Article, 2003
  • C.Stillman, R.C.Barklie, C.Johnson, Viking iron-smelting in Dublin`s Temple Bar West, Geology Today, 19, (6), 2003, p216 - 218Journal Article, 2003
  • C.O`Raifeartaigh,R.C.Barklie,J.K.N.Lindner, EPR study of defects produced by MeV Ag ion implantion into silicon, Nuclear Instruments and Methods in Physics Research B, 217, 2004, p442 - 448Journal Article, 2004
  • C.O`Raifeartaigh, M.Alhourani,F.Leonard,R.C.Barklie, Spin-dependent magnetophotoconductivity in silicon-on-sapphire, Journal of Applied Physics, 96, (11), 2004, p6557 - 6560Journal Article, 2004
  • R.C.Barklie,C.E.Blount,B.Henderson,D.O`Connell, Photochromic reaction involving Cr ions and defects in magnesium oxide, Journal of Physics C ;Solid State Physics, 16, 1983, pL859 - L862Journal Article, 1983
  • R.C.Barklie,J.R.Niklas,J.M.Spaeth,R.H.Bartram, ENDOR and EPR of defects in relatively stoichiometric beta-alumina, Journal of Physics C :Solid State Physics, 16, 1983, p579 - 590Journal Article, 1983
  • R.C.Barklie,J.R.Niklas,J.M.Spaeth, ENDOR measurements of defects in sodium beta-alumina :I, Journal of Physics C:Solid State Physics, 13, 1980, p1745 - 1755Journal Article, 1980
  • R.C.Barklie,J.R.Niklas,J.M.Spaeth, ENDOR measurements of defects in sodium beta-alumina :II, Journal of Physics C:Solid State Physics, 13, 1980, p1757 - 1765Journal Article, 1980
  • R.C.Barklie,J.R.Niklas,J.M.Spaeth, ENDOR investigations of defects in sodium beta-alumina, Journal de Physique, 41, 1980, pC6-537 - C6-539Journal Article, 1980
  • R.C.Barklie,K.O`Donnell,B.Henderson, EPR of Ag2+ in beta-alumina, Journal of Physics C:Solid State Physics, 11, 1978, p3881 - 3887Journal Article, 1978
  • R.C.Barklie,K.O`Donnell,A.Murtagh, ESR of Mn2+ diffused into sodium beta-alumina, Journal of Physics C:Solid State Physics, 10, 1977, p4815 - 4820Journal Article, 1977
  • R.C.Barklie,K.O`Donnell, ESR of Mn2+ in sodium beta-alumina, Journal of Physics C : Solid State Physics, 10, 1977, p4127 - 4135Journal Article, 1977
  • R.C.Barklie,D.Shoenberg, Possible Field Dependence of Landau Level-Broadening, Physics of Condensed Matter, 19, 1975, p175 - 183Journal Article, 1975
  • R.C.Barklie, The Hall Effect in Tin, Philosophical Magazine, 23, (181), 1971, p175 - 189Journal Article, 1971
  • R.C.Barklie,A.B.Pippard, Oscillatory Hall effect in tin due to magnetic breakdown, Proceedings of the Royal Society of London, A 317, 1970, p167 - 186Journal Article, 1970
  • K.O`Donnell,R.C.Barklie,B.Henderson, EPR and optical absorption studies of radiation produced defects in sodium beta-alumina, Journal of Physics C:Solid State Physics, 11, 1978, p3871 - 3879Journal Article, 1978
  • B.J.Jones,R.C.Barklie, Electron paramagnetic resonance evaluation of defects at the (100)Si/Al2O3 interface, Journal of Physics D:Applied Physics, 38, 2005, p1178 - 1181Journal Article, 2005
  • R.C.Barklie and C.O`Raifeartaigh, Electron paramagnetic resonance characterization of defects produced by ion implantation into silicon, Journal of Physics : Condensed Matter, 17, 2005, pS2351 - S2360Journal Article, 2005
  • PACAUD, Y, BRAUER, G, PEREZRODRIGUEZ, A, STOEMENOS, J, BARKLIE, R, VOELSKOW, M, SKORUPA, W, STUDY OF THE DIFFERENT STAGES OF DAMAGE INDUCED BY 200 KEV GE+ ION IMPLANTATION IN 6H-SIC, INSTITUTE OF PHYSICS CONFERENCE SERIES, 142, 1996, p537 - 540Journal Article, 1996
  • PRIOLO, F, FRANZO, G, COFFA, S, POLMAN, A, LIBERTINO, S, BARKLIE, R, CAREY, D, THE ERBIUM-IMPURITY INTERACTION AND ITS EFFECTS ON THE 1.54 MU-M LUMINESCENCE OF ER3+ IN CRYSTALLINE SILICON, JOURNAL OF APPLIED PHYSICS, 78, 1995, p3874 - 3882Journal Article, 1995
  • ONEILL, P, BIRKINSHAW, C, LEAHY, JJ, BARKLIE, R, THE ROLE OF LONG LIVED FREE RADICALS IN THE AGEING OF IRRADIATED ULTRA HIGH MOLECULAR WEIGHT POLYETHYLENE, POLYMER DEGRADATION AND STABILITY, 63, 1999, p31 - 39Journal Article, 1999
  • ORAIFEARTAIGH, C, BARKLIE, RC, LARSEN, AN, PRIOLO, F, FRANZO, G, LULLI, G, BIANCONI, M, LINDNER, JKN, CRISTIANO, F, HEMMENT, PLF, 2 MEV SI ION IMPLANTATION DAMAGE IN RELAXED SI1-XGEX, NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 120, 1997, p165 - 168Journal Article, 1997
  • BARKLIE, RC, A COMPARATIVE EPR STUDY OF ION IMPLANTATION INDUCED DAMAGE IN SI, SI1-XGEX(X NOT EQUAL 0) AND SIC, NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 120, 1997, p139 - 146Journal Article, 1997
  • BARKLIE, RC, COLLINS, M, RICHARDSON, M, BORDE, I, AN ELECTRON PARAMAGNETIC RESONANCE STUDY OF DEFECTS IN PECVD SILICON OXIDES, JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 12, 2001, p231 - 234Journal Article, 2001
  • BARKLIE, RC, COLLINS, M, CUNNIFFE, J, SILVA, SRP, AN EPR STUDY OF DEFECTS IN HYDROGENATED AMORPHOUS CARBON THIN FILMS, DIAMOND AND RELATED MATERIALS, 7, 1998, p864 - 868Journal Article, 1998
  • BARKLIE, RC, COLLINS, M, HOLM, B, PACAUD, Y, SKORUPA, W, AN EPR STUDY OF DEFECTS INDUCED IN 6H-SIC BY ION IMPLANTATION, JOURNAL OF ELECTRONIC MATERIALS, 26, 1997, p137 - 143Journal Article, 1997
  • SEALY, L, BARKLIE, RC, BROWN, WL, JACOBSON, DC, ANNEALING OF DEFECTS CREATED IN SILICON BY MEV ION-IMPLANTATION, NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 80-1, 1993, p528 - 531Journal Article, 1993
  • HENRY, MO, MCGUIGAN, KG, BARKLIE, RC, BOUND EXCITON RECOMBINATION AT MN-ZN PAIR CENTERS IN SILICON, SOLID STATE COMMUNICATIONS, 64, 1987, p31 - 33Journal Article, 1987
  • BARKLIE, RC, GUVEN, J, C-13 HYPERFINE-STRUCTURE AND RELAXATION-TIMES OF THE P1 CENTER IN DIAMOND, JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 14, 1981, p3621 - 3631Journal Article, 1981
  • BARKLIE, RC, CHARACTERISATION OF DEFECTS IN AMORPHOUS CARBON BY ELECTRON PARAMAGNETIC RESONANCE, DIAMOND AND RELATED MATERIALS, 10, 2001, p174 - 181Journal Article, 2001
  • COLLINS, M, BARKLIE, RC, ANGUITA, JV, CAREY, JD, SILVA, SRP, CHARACTERISATION OF DEFECTS IN THIN FILMS OF HYDROGENATED AMORPHOUS CARBON, DIAMOND AND RELATED MATERIALS, 9, 2000, p781 - 785Journal Article, 2000
  • STOLK, PA, SARIS, FW, BERNTSEN, AJM, VANDERWEG, WF, SEALY, LT, BARKLIE, RC, KROTZ, G, MULLER, G, CONTRIBUTION OF DEFECTS TO ELECTRONIC, STRUCTURAL, AND THERMODYNAMIC PROPERTIES OF AMORPHOUS-SILICON, JOURNAL OF APPLIED PHYSICS, 75, 1994, p7266 - 7286Journal Article, 1994
  • BARKLIE, RC, ENNIS, TJ, REESON, K, HEMMENT, PLF, DEFECT PRODUCTION DURING THE FABRICATION OF SOI BY OXYGEN ION-IMPLANTATION, APPLIED SURFACE SCIENCE, 36, 1989, p400 - 407Journal Article, 1989
  • HOBBS, A, BARKLIE, RC, REESON, K, HEMMENT, PLF, DEFECTS AT THE SI/SIO2 INTERFACE OF SIO2 PRECIPITATES IN SILICON, ZEITSCHRIFT FUR PHYSIKALISCHE CHEMIE-FRANKFURT, 151, 1987, p251 - 257Journal Article, 1987
  • BARKLIE, RC, ENNIS, TJ, HEMMENT, PLF, REESON, K, DEFECTS IN SIO2 IN BURIED-OXIDE STRUCTURES FORMED BY O+ IMPLANTATION, NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 32, 1988, p433 - 436Journal Article, 1988
  • BARKLIE, RC, ENNIS, TJ, REESON, KJ, HEMMENT, PLF, E1' CENTERS IN BURIED OXIDE LAYERS FORMED BY OXYGEN ION-IMPLANTATION INTO SILICON, NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 65, 1992, p93 - 96Journal Article, 1992
  • KHAN, RUA, CAREY, JD, SILVA, SRP, JONES, BJ, BARKLIE, RC, ELECTRON DELOCALIZATION IN AMORPHOUS CARBON BY ION IMPLANTATION, PHYSICAL REVIEW B, 63, 2001, part. no. - 121201Journal Article, 2001
  • CAREY, JD, BARKLIE, RC, DONEGAN, JF, PRIOLO, F, FRANZO, G, COFFA, S, ELECTRON PARAMAGNETIC RESONANCE AND PHOTOLUMINESCENCE STUDY OF ER-IMPURITY COMPLEXES IN SI, PHYSICAL REVIEW B, 59, 1999, p2773 - 2782Journal Article, 1999
  • COLEMAN, JN, OBRIEN, DF, DALTON, AB, MCCARTHY, B, LAHR, B, BARKLIE, RC, BLAU, WJ, ELECTRON PARAMAGNETIC RESONANCE AS A QUANTITATIVE TOOL FOR THE STUDY OF MULTIWALLED CARBON NANOTUBES, JOURNAL OF CHEMICAL PHYSICS, 113, 2000, p9788 - 9793Journal Article, 2000
  • CAREY, JD, DONEGAN, JF, BARKLIE, RC, PRIOLO, F, FRANZO, G, COFFA, S, ELECTRON PARAMAGNETIC RESONANCE OF ERBIUM DOPED SILICON, APPLIED PHYSICS LETTERS, 69, 1996, p3854 - 3856Journal Article, 1996
  • JONES, BJ, BARKLIE, RC, KHAN, RUA, CAREY, JD, SILVA, SRP, ELECTRON PARAMAGNETIC RESONANCE STUDY OF ION IMPLANTATION INDUCED DEFECTS IN AMORPHOUS HYDROGENATED CARBON, DIAMOND AND RELATED MATERIALS, 10, 2001, p993 - 997Journal Article, 2001
  • BRADDELL, O, BARKLIE, RC, DOFF, DH, GANGAS, NHJ, MCKIMM, A, ELECTRON-PARAMAGNETIC-RES OF CU-2+ IONS IN PILLARED CLAY, ZEITSCHRIFT FUR PHYSIKALISCHE CHEMIE-FRANKFURT, 151, 1987, p157 - 164Journal Article, 1987
  • BARKLIE, RC, HOBBS, A, HEMMENT, PLF, ELECTRON-PARAMAGNETIC-RES OF DEFECTS IN SILICON-ON-INSULATOR STRUCTURES, RADIATION EFFECTS AND DEFECTS IN SOLIDS, 99, 1986, p83 - 87Journal Article, 1986
  • BARKLIE, RC, HOBBS, A, HEMMENT, PLF, REESON, K, ELECTRON-PARAMAGNETIC-RES OF DEFECTS IN SILICON-ON-INSULATOR STRUCTURES FORMED BY ION-IMPLANTATION .1. O+ IMPLANTATION, JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 19, 1986, p6417 - 6432Journal Article, 1986
  • HOBBS, A, BARKLIE, RC, HEMMENT, PLF, REESON, K, ELECTRON-PARAMAGNETIC-RES OF DEFECTS IN SILICON-ON-INSULATOR STRUCTURES FORMED BY ION-IMPLANTATION .2. N+ IMPLANTATION, JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 19, 1986, p6433 - 6439Journal Article, 1986
  • BARKLIE, RC, GIRARD, O, BRADDELL, O, ELECTRON-PARAMAGNETIC-RES OF VO2+ IN A NAFION MEMBRANE, JOURNAL OF PHYSICAL CHEMISTRY, 92, 1988, p1371 - 1377Journal Article, 1988
  • LACERDA, M, LEJEUNE, M, JONES, BJ, BARKLIE, RC, BOUZERAR, R, ZELLAMA, K, CONWAY, NMJ, GODET, C, ELECTRONIC PROPERTIES OF AMORPHOUS CARBON NITRIDE A-C1-XNX : H FILMS INVESTIGATED USING VIBRATIONAL AND ESR CHARACTERISATIONS, JOURNAL OF NON-CRYSTALLINE SOLIDS, 299, 2002, p907 - 911Journal Article, 2002
  • SEALY, L, BARKLIE, RC, REESON, KJ, BROWN, WL, JACOBSON, DC, EPR AND RBS STUDY OF DEFECTS PRODUCED BY MEV ION-IMPLANTATION INTO SILICON, NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 62, 1992, p384 - 387Journal Article, 1992
  • SEALY, L, BARKLIE, RC, LULLI, G, NIPOTI, R, BALBONI, R, MILITA, S, SERVIDORI, M, EPR AND X-RAY-DIFFRACTION STUDY OF DAMAGE PRODUCED BY IMPLANTATION OF B IONS (50 KEV, 1 MEV) OR SI IONS (50 KEV, 700 KEV, 1.5 MEV) INTO SILICON, NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 96, 1995, p215 - 218Journal Article, 1995
  • BARKLIE, RC, COLLINS, M, SILVA, SRP, EPR LINEWIDTH VARIATION, SPIN RELAXATION TIMES, AND EXCHANGE IN AMORPHOUS HYDROGENATED CARBON, PHYSICAL REVIEW B, 61, 2000, p3546 - 3554Journal Article, 2000
  • ORAIFERTAIGH, C, BARKLIE, RC, REESON, K, HEMMENT, PLF, EPR OF DEFECTS FORMED BY THE IMPLANTATION INTO SILICON OF HIGH-DOSES OF CARBON, SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 5, 1990, p78 - 82Journal Article, 1990
  • BRADDELL, O, BARKLIE, RC, DOFF, DH, EPR OF VO2+ IONS IN AL-PILLARED MONTMORILLONITE, CLAY MINERALS, 25, 1990, p15 - 25Journal Article, 1990
  • CAREY, JD, BARKLIE, RC, DONEGAN, JF, PRIOLO, F, FRANZO, G, COFFA, S, EPR STUDY OF ERBIUM-IMPURITY COMPLEXES IN SILICON, JOURNAL OF LUMINESCENCE, 80, 1999, p297 - 301Journal Article, 1999
  • HEMMENT, PLF, CRISTIANO, F, NEJIM, A, LOMBARDO, S, LARSSEN, KK, PRIOLO, F, BARKLIE, RC, GE+ ION IMPLANTATION - A COMPETING TECHNOLOGY?, JOURNAL OF CRYSTAL GROWTH, 157, 1996, p147 - 160Journal Article, 1996
  • MURPHY, R, COLEMAN, JN, CADEK, M, MCCARTHY, B, BENT, M, DRURY, A, BARKLIE, RC, BLAU, WJ, HIGH-YIELD, NONDESTRUCTIVE PURIFICATION AND QUANTIFICATION METHOD FOR MULTIWALLED CARBON NANOTUBES, JOURNAL OF PHYSICAL CHEMISTRY B, 106, 2002, p3087 - 3091Journal Article, 2002
  • PACAUD, Y, SKORUPA, W, PEREZRODRIGUEZ, A, BRAUER, G, STOEMENOS, J, BARKLIE, RC, INVESTIGATION OF THE DAMAGE INDUCED BY 200 KEV GE+ ION IMPLANTATION IN 6H-SIC, NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 112, 1996, p321 - 324Journal Article, 1996
  • PRIOLO, F, SPINELLA, C, ALBERTAZZI, E, BIANCONI, M, LULLI, G, NIPOTI, R, LINDNER, JKN, MESLI, A, BARKLIE, RC, SEALY, L, HOLM, B, LARSEN, AN, ION IMPLANTATION INDUCED DAMAGE IN RELAXED SI0.75GE0.25, NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 112, 1996, p301 - 304Journal Article, 1996
  • COLEMAN, JN, OBRIEN, DF, DALTON, AB, MCCARTHY, B, LAHR, B, DRURY, A, BARKLIE, RC, BLAU, WJ, MEASUREMENT OF NANOTUBE CONTENT IN PYROLYTICALLY GENERATED CARBON SOOT, CHEMICAL COMMUNICATIONS, 2000, p2001 - 2002Journal Article, 2000
  • LARSEN, AN, ORAIFEARTAIGH, C, BARKLIE, RC, HOLM, B, PRIOLO, F, FRANZO, G, LULLI, G, BIANCONI, M, NIPOTI, R, LINDNER, JKN, MESLI, A, GROB, JJ, CRISTIANO, F, HEMMENT, PLF, MEV ION IMPLANTATION INDUCED DAMAGE IN RELAXED SI1-XGEX, JOURNAL OF APPLIED PHYSICS, 81, 1997, p2208 - 2218Journal Article, 1997
  • COLEMAN, JN, OBRIEN, DF, MCCARTHY, B, BARKLIE, RC, BLAU, WJ, NANOTUBE CONTENT IN ARC GENERATED CARBON POWDER, MONATSHEFTE FUR CHEMIE, 132, 2001, p53 - 61Journal Article, 2001
  • CADEK, M, MURPHY, R, MCCARTHY, B, DRURY, A, LAHR, B, BARKLIE, RC, PANHUIS, M, COLEMAN, JN, BLAU, WJ, OPTIMISATION OF THE ARC-DISCHARGE PRODUCTION OF MULTI-WALLED CARBON NANOTUBES, CARBON, 40, 2002, p923 - 928Journal Article, 2002
  • COLEMAN, JN, CURRAN, S, DALTON, AB, DAVEY, AP, MCCARTHY, B, BLAU, W, BARKLIE, RC, PERCOLATION-DOMINATED CONDUCTIVITY IN A CONJUGATED-POLYMER-CARBON-NANOTUBE COMPOSITE, PHYSICAL REVIEW B, 58, 1998, pR7492 - R7495Journal Article, 1998
  • COLEMAN, JN, DALTON, AB, CURRAN, S, RUBIO, A, DAVEY, AP, DRURY, A, MCCARTHY, B, LAHR, B, AJAYAN, PM, ROTH, S, BARKLIE, RC, BLAU, WJ, PHASE SEPARATION OF CARBON NANOTUBES AND TURBOSTRATIC GRAPHITE USING A FUNCTIONAL ORGANIC POLYMER, ADVANCED MATERIALS, 12, 2000, p213 - +Journal Article, 2000
  • BARKLIE, RC, OCONNELL, DO, HENDERSON, B, BLOUNT, CE, PHOTOCHROMIC REACTIONS IN MGO-MG, RADIATION EFFECTS AND DEFECTS IN SOLIDS, 73, 1983, p199 - 206Journal Article, 1983
  • COLEMAN, JN, CURRAN, S, DALTON, AB, DAVEY, AP, MC CARTHY, B, BLAU, W, BARKLIE, RC, PHYSICAL DOPING OF A CONJUGATED POLYMER WITH CARBON NANOTUBES, SYNTHETIC METALS, 102, 1999, p1174 - 1175Journal Article, 1999
  • COLEMAN, JN, OBRIEN, DF, PANHUIS, MIH, DALTON, AB, MCCARTHY, B, BARKLIE, RC, BLAU, WJ, SOLUBILITY AND PURITY OF NANOTUBES IN ARC DISCHARGE CARBON POWDER, SYNTHETIC METALS, 121, 2001, p1229 - 1230Journal Article, 2001
  • SOMMER, T, BARKLIE, RC, DAVEY, A, BLAU, W, SPIN-DEPENDENT CONDUCTIVITY AND EPR STUDY OF UNDOPED AND DOPED POLY(TERTIARYBUTYLISOTHIANAPHTHENE), SYNTHETIC METALS, 76, 1996, p259 - 262Journal Article, 1996
  • ORAIFEARTAIGH, C, BRADLEY, L, BARKLIE, RC, HODGE, AM, RICHMOND, ED, SPIN-DEPENDENT PHOTOCONDUCTIVITY IN CVD-GROWN AND MBE-GROWN SILICON-ON-SAPPHIRE, SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 10, 1995, p1595 - 1603Journal Article, 1995
  • BARKLIE, RC, SEALY, L, THE EFFECT OF A NONUNIFORM MODULATION FIELD ON DETERMINATION OF THE NUMBER OF UNPAIRED ELECTRON SPINS BY EPR, JOURNAL OF MAGNETIC RESONANCE, 97, 1992, 611 - 615Miscellaneous, 1992
  • ENNIS, TJ, BARKLIE, RC, REESON, K, HEMMENT, PLF, THE EFFECT OF IMPLANTATION TEMPERATURE ON DEFECT PRODUCTION IN SIMOX STRUCTURES, SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 4, 1989, p626 - 632Journal Article, 1989
  • BARKLIE, RC, ENNIS, TJ, REESON, K, HEMMENT, PLF, THE LOCATION AND ANNEALING OF PARAMAGNETIC OXYGEN VACANCIES (E'1 CENTERS) IN SILICON IMPLANTED WITH HIGH-DOSES OF OXYGEN, JOURNAL OF PHYSICS-CONDENSED MATTER, 3, 1991, p2115 - 2129Journal Article, 1991
  • B.J.Jones ,R.C.Barklie, Analysis of defects at the interface between high-k thin films and (100) silicon, Microelectronic Engineering, 80, 2005, p74 - 77Journal Article, 2005
  • Sandra Wright and R.C.Barklie, EPR characterisation of defects in monoclinic powders of ZrO2 and HfO2, Materials Science in Semiconductor Processing, 9, 2006, p892 - 896Journal Article, 2006
  • Coleman, J. N.; O'Brien, D. F.; Dalton, A. B.; McCarthy, B.; Lahr, B.; Barklie, R. C.; Blau, W. J., Electron paramagnetic resonance as a quantitative tool for the study of multiwalled carbon nanotubes, Journal of Chemical Physics, 113, 2000, p9788 - 9793Journal Article, 2000, DOI
  • J.N. Coleman, D.F. O'Brien, M. in het Panhuis, A.B. Dalton, B. McCarthy and R.C. Barklie and W. J. Blau, High electron injection currents from a nanotube composite in an organic heterojunction, Synthetic Metals, 121, (1-3), 2001, p1227 - 1228Journal Article, 2001, DOI
  • Jonathan N. Coleman, Diarmuid F. O'Brien, Brendan McCarthy, Robert C. Barklie and Werner J. Blau, Nanotube Content in Arc Generated Carbon Powder , Monatshefte für Chemie / Chemical Monthly, 132, (1), 2001, p53 - 61Journal Article, 2001, DOI
  • M. Cadek, R. Murphy, B. McCarthy, A. Drury, B. Lahr, R. C. Barklie, M. in het Panhuis, J. N. Coleman and W. J. Blau, Optimisation of the arc-discharge production of multi-walled carbon nanotubes, Carbon, 40, (6), 2002, p923 - 928Journal Article, 2002, DOI
  • J. N. Coleman, S. Curran, A. B. Dalton, A. P. Davey, B. McCarthy, W. Blau, and R. C. Barklie, Percolation-dominated conductivity in a conjugated-polymer-carbon-nanotube composite, Physical Review B, 58, (12), 1998, pR7492 - R7495Journal Article, 1998, DOI , TARA - Full Text
  • Jonathan N. Coleman, Alan B. Dalton, Seamus Curran, Angel Rubio, Andrew P. Davey, Anna Drury, Brendan McCarthy, Bernd Lahr, Pulickel M. Ajayan, Siegmar Roth, Robert C. Barklie, and Werner J. Blau, Phase Separation of Carbon Nanotubes and Turbostratic Graphite Using a Functional Organic Polymer , Advanced Materials, 12, (3), 2000, p213 - 217Journal Article, 2000, DOI
  • J. N. Coleman, D. F. O'Brien, M. in het Panhuis, A. B. Dalton, B. McCarthy, R. C. Barklie and W. J. Blau, Solubility and purity of nanotubes in arc discharge carbon powder , Synthetic Metals, 121, (1-3), 2001, p1229 - 1230Journal Article, 2001, DOI
  • J. D. Carey, R. C. Barklie, and J. F. Donegan , F. Priolo , G. Franzò and S. Coffa , Electron paramagnetic resonance and photoluminescence study of Er-impurity complexes in Si, Physical Review B, 59, (4), 1999, p2773 - 2782Journal Article, 1999, DOI , TARA - Full Text
  • J. D. Carey, J. F. Donegan, and R. C. Barklie, F. Priolo, G. Franzò and S. Coffa, Electron paramagnetic resonance of erbium doped silicon, Applied Physics Letters, 69, 1996, p3854 - 3856Journal Article, 1996, DOI , TARA - Full Text
  • Sandra Wright and R.C.Barklie, EPR characterisation of defects in m-HfO2, Journal of Material Science:Materials in Electronics, 18, 2007, p743 - 746Journal Article, 2007
  • Sandra Wright,S.Feeney and R.C.Barklie, EPR study of defects in as-received, gamma -irradiated and annealed monoclinic HfO2 powder , Microelectronic Engineering, 84, 2007, p2378 - 2381Journal Article, 2007
  • L.McGuigan, R.C.Barklie, R.G.S.Sofin,S.K.Arora, I.V.Shvets, In-plane magnetic anisotropies in Fe3O4 films on vicinal MgO (100), Physical Review B, 77, 2008, p174424-1 - 174424-9Journal Article, 2008
  • B.J.Jones,S.Wright,R.C.Barklie,J.Tyas,J.Franks,A.J.Reynolds, Nanostructure and paramagnetic centres in diamond-like carbon ; Effect of Ar dilution in PECVD process, Diamond and Related Materials, 17, 2008, p1629 - 1632Journal Article, 2008
  • K.Cherkaoui,S.Monaghan,M.A.Negara,M.Modreanu,P.K.Hurley,D.O`Connell,S.McDonnell,G.Hughes,S.Wright,R.C.Barklie,P.Bailey,T.C.Q.Noakes, Electrical,structural and chemical properties of HfO2 films formed by electron beam evaporation, Journal of Applied Physics, 104, 2008, p064113-1 - 064113-10Journal Article, 2008
  • R.C.Barklie and Sandra Wright, Electron paramagnetic resonance characterization of defects in HfO2 and ZrO2 powders and films, Journal of Vacuum Science and Technology B: Microelectronics and Nanometre structures, 27, (1), 2009, p317 - 320Journal Article, 2009
  • Coleman, J.N., Curran, S., Dalton, A.B., Davey, A.P., Mc Carthy, B., Blau, W., Barklie, R.C. , Physical Doping of a Conjugated Polymer with Carbon Nanotubes , Synthetic Metals, 102, (1-3), 1999, p1174 - 1175Journal Article, 1999, DOI
  • Sommer, T., Barklie, R.C., Davey, A., Blau, W. , Spin-dependent conductivity and EPR study of undoped and doped poly (tertiarybutylisothianaphthene), Synthetic Metals, 76, (1-3), 1996, p259 - 262Journal Article, 1996, DOI , URL
  • Sandra Wright and R.C.Barklie, Electron paramagnetic resonance characterization of defects in monoclinic HfO2 and ZrO2 powders , Journal of Applied Physics, 106, 2009, p103917-1 - 103917-15Journal Article, 2009

Research Expertise

Applications of the techniques of Electron Paramagnetic Resonance, Ferromagnetic Resonance and Electrically Detected Magnetic Resonance to the characterisation of atomic defects, ions , radicals etc with unpaired electron spin in a wide variety of materials. Current research is focused on 1) the characterisation of atomic defects in high k dielectrics on silicon and 2) the investigation of the magnetic properties of thin films of magnetite and other magnetic materials using primarily the technique of Ferromagnetic Resonance.

  • Title
    Oxide Thin Films
    Summary
    Two projects are being undertaken - the first is the characterisation of defects in high k dielectrics and at their interface with silicon and the second is an investigation of the magnetic properties of ferromagnetic oxides. The further scaling down in the size of the type of electronic circuits used in microprocessors will shortly require the replacement of SiO2 as the gate dielectric in silicon MOSFETs ;it will need to be replaced with a material with a higher dielectric constant such as HfO2 or ZrO2.Since atomic defects in such materials or at their interface with silicon can degrade the device performance it is important to characterise such defects with a view to reducing their population and this is the aim of this project. The second project is to characterise the magnetic properties of ferromagnetic (or ferrimagnetic) thin films such as magnetite or doped ZnO.Such materials are being investigated because of their possible use in the field of Spintronics and the aim of this project is to characterise these materials using primarily the technique of Ferromagnetic Resonance.
    Funding Agency
    HEA
    Date From
    2002
    Date To
    2007

Recognition

  • Fellow of Trinity College Dublin 1993
  • Institute of Physics