Our research focuses on characterization and manipulation of structures at the atomic scale. Our ultimate goal is to advance the knowledge of charged-beam microscopy. It will allow us to better understand physical and chemical properties of novel materials, especially nanostructures, and thus facilitates the design, fabrication, and application of advanced materials and devices.

One particular focus of our group is the development and application of scanning helium ion microscopy (HIM). To understand the unique contrast mechanisms provided by He ions, we are interested in the physics of ion-matter interaction and details of signal generation and detection.

We are also interested in developing and utilising a variety of detectors for the spectroscopic characterisation of nanomaterials such as a cathodoluminescence detector.