Our research activity spans both hardware and software development for the STEM, with areas including ADF normalisation by detector efficiency, correction of scan-noise and scan-distortion, and correction of artefacts in EELS spectra. We research and develop techniques for picometer-scale precision imaging, low-dose STEM, novel scanning strategies, and hysteresis-mitigation.

Dr. Lewys Jones FRMS MInstP

Ussher Assistant Professor in Ultramicroscopy Royal Society & Science Foundation Ireland (SFI) University Research Fellow

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Principal Investigator