Ultramicroscopy Research Group
Our research activity spans both hardware and software development for the STEM, with areas including ADF normalisation by detector efficiency, correction of scan-noise and scan-distortion, and correction of artefacts in EELS spectra. We research and develop techniques for picometer-scale precision imaging, low-dose STEM, novel scanning strategies, and hysteresis-mitigation.
Principle Investigator
Dr. Lewys Jones FRMS MInstP
Ussher Assistant Professor in Ultramicroscopy
Royal Society & Science Foundation Ireland (SFI) University Research Fellow
Advanced Microscopy Laboratory & School of Physics,
Trinity College Dublin
Co-director SFI-EPSRC Centre for Doctoral Training in Advanced Characterisation
AMBER Research Centre,
Trinity College Dublin
E-mail: lewys.jones@tcd.ie
Phone: +353 1 896 4171
Twitter: @TCD_Ultramic