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Ultramicroscopy Research Group

The Ultramicroscopy group is based around exploring the design and function of the aberration-corrected scanning transmission electron microscope (STEM). Based in the Advanced Microscopy Laboratory, we work to improve the acquisition and analysis of atomic-resolution annular dark-field (ADF) data and EELS and EDX chemical mapping. Themes include ADF normalisation by detector efficiency, correction of scan-noise and scan-distortion and correction of artefacts in EELS spectra. As part of this research, a series of image analysis and processing codes have been written to inspect, improve and quantify atomic-resolution ADF STEM data.
High-performance Rigid & Non-rigid Registration Automated image alignment / stitching for ADF STEM time, focal and camera-length series.
Digital Super-resolution in the STEM Combined non-rigid registration & template-matching for low dose-rate high-precision imaging.
STEM Image Scan-noise Compensation Software Correcting scan-noise and image-drift to improve both resolution and SNR and simplify image interpretation.
Atomic Resolution Imaging and 3D Nano-metrology Combining ADF STEM atom-counting with atomistic modelling for improved catalyst design.
ADF Calibration for High-precision Quantitative STEM Precise quantification of HAADF STEM data requires accurate mapping of the ADF detector sensitivity as well as calibration of the microscope’s amplifier.

Principle Investigator

Dr. Lewys Jones FRMS MInstP

Ussher Assistant Professor in Ultramicroscopy
School of Physics & Advanced Microscopy Laboratory
Trinity College Dublin
E-mail: lewys.jones@tcd.ie
Phone: +353 1 896 4171
Twitter: @TCD_Ultramic