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Ultramicroscopy Research Group

High-performance Rigid & Non-rigid Registration Automated image alignment / stitching for ADF STEM time, focal and camera-length series.

Electron-optics design & evaluation Utilising simulations to predict, evaluate and improve TEM lens performance.

Digital Super-resolution in the STEM Combined non-rigid registration & template-matching for low dose-rate high-precision imaging.

STEM Image Scan-noise Compensation Software Correcting scan-noise and image-drift to improve both resolution and SNR and simplify image interpretation.

ADF Calibration for High-precision Quantitative STEM Precise quantification of HAADF STEM data requires accurate mapping of the ADF detector sensitivity as well as calibration of the microscope’s amplifier.

Our research activity spans both hardware and software development for the STEM, with areas including ADF normalisation by detector efficiency, correction of scan-noise and scan-distortion, and correction of artefacts in EELS spectra. We research and develop techniques for picometer-scale precision imaging, low-dose STEM, novel scanning strategies, and hysteresis-mitigation.

Principal Investigator