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Ultramicroscopy

STEM Image Scan-noise Compensation Software Correcting scan-noise and image-drift to improve both resolution and SNR and simplify image interpretation.

High-performance Rigid & Non-rigid Registration Automated image alignment / stitching for ADF STEM time, focal and camera-length series.

Digital Super-resolution in the STEM Combined non-rigid registration & template-matching for low dose-rate high-precision imaging.

Atomic Resolution Imaging and 3D Nano-metrology Combining ADF STEM atom-counting with atomistic modelling for improved catalyst design.

ADF Calibration for High-precision Quantitative STEM Precise quantification of HAADF STEM data requires accurate mapping of the ADF detector sensitivity as well as calibration of the microscope’s amplifier.

STM Scan-distortion Compensation Correction of scanning tunnelling microscope tip-height and stage instabilities for improved resolution and SNR.

Hi, I’m Dr. Lewys Jones, my current research in metrology development is based around exploring the design and function of the aberration-corrected scanning transmission electron microscope (STEM), to improve the analysis of atomic-resolution annular dark-field (ADF) data and EELS and EDX chemical mapping. Themes include ADF normalisation by detector efficiency, correction of scan-noise and scan-distortion and correction of artefacts in EELS spectra. As part of this research, a series of image analysis and processing codes have been written to inspect, improve and quantify atomic-resolution ADF STEM data.