Ultramicroscopy Research Group

High-performance Rigid & Non-rigid Registration Automated image alignment / stitching for ADF STEM time, focal and camera-length series.

Electron-optics design & evaluation Utilising simulations to predict, evaluate and improve TEM lens performance.

Digital Super-resolution in the STEM Combined non-rigid registration & template-matching for low dose-rate high-precision imaging.

STEM Image Scan-noise Compensation Software Correcting scan-noise and image-drift to improve both resolution and SNR and simplify image interpretation.

ADF Calibration for High-precision Quantitative STEM Precise quantification of HAADF STEM data requires accurate mapping of the ADF detector sensitivity as well as calibration of the microscope’s amplifier.

The Ultramicroscopy group is based around exploring the design and function of the aberration-corrected scanning transmission electron microscope (STEM). Based in the Advanced Microscopy Laboratory, we work to improve the acquisition and analysis of atomic-resolution annular dark-field (ADF) imaging data and EELS & EDX chemical mapping.

Our research spans both hardware and software development for the STEM, and areas include ADF normalisation by detector efficiency, correction of scan-noise and scan-distortion and correction of artefacts in EELS spectra.

Principle Investigator

Dr. Lewys Jones FRMS MInstP

Ussher Assistant Professor in Ultramicroscopy
Royal Society & Science Foundation Ireland (SFI) University Research Fellow
Advanced Microscopy Laboratory & School of Physics,
Trinity College Dublin

Co-director SFI-EPSRC Centre for Doctoral Training in Advanced Characterisation
AMBER Research Centre,
Trinity College Dublin

E-mail: lewys.jones@tcd.ie
Phone: +353 1 896 4171
Twitter: @TCD_Ultramic