Ultramicroscopy Research Group
The Ultramicroscopy group is based around exploring the design and function of the aberration-corrected scanning transmission electron microscope (STEM). Based in the Advanced Microscopy Laboratory, we work to improve the acquisition and analysis of atomic-resolution annular dark-field (ADF) data and EELS and EDX chemical mapping. Themes include ADF normalisation by detector efficiency, correction of scan-noise and scan-distortion and correction of artefacts in EELS spectra. As part of this research, a series of image analysis and processing codes have been written to inspect, improve and quantify atomic-resolution ADF STEM data.
High-performance Rigid & Non-rigid Registration Automated image alignment / stitching for ADF STEM time, focal and camera-length series.
Digital Super-resolution in the STEM Combined non-rigid registration & template-matching for low dose-rate high-precision imaging.
STEM Image Scan-noise Compensation Software Correcting scan-noise and image-drift to improve both resolution and SNR and simplify image interpretation.
Atomic Resolution Imaging and 3D Nano-metrology Combining ADF STEM atom-counting with atomistic modelling for improved catalyst design.
Dr. Lewys Jones FRMS MInstP
Ussher Assistant Professor in Ultramicroscopy
School of Physics & Advanced Microscopy Laboratory
Trinity College Dublin
Phone: +353 1 896 4171