Publications and Further Research Outputs
Peer-Reviewed Publications
Gabbett, C. and Doolan, L. and Synnatschke, K. and Gambini, L. and Coleman, E. and Kelly, A.G. and Liu, S. and Caffrey, E. and Munuera, J. and Murphy, C. and Sanvito, S. and Jones, L. and Coleman, J.N., Quantitative analysis of printed nanostructured networks using high-resolution 3D FIB-SEM nanotomography, Nature Communications, 15, (1), 2024
Conroy, M.S. and O'Connell, E. and Moore, K. and Jones, L. and Ramasse, Q. and Griffin, S. and Ophus, C., Probing the Atomic-Scale Internal Phases with the Electron Beam of Mutliferroic Domain Walls Formed During Dynamics, Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada, 29, (1), 2023, p1363
Nordahl, Gregory and Jones, Lewys and Christiansen, Emil Frang and Hunnestad, Kasper Aas and Nord, Magnus, Correcting for probe wandering by precession path segmentation, Ultramicroscopy, 248, 2023, p113715-
McBean, P. and Alves, G.M. and Thompson, F. and Sagawa, R. and Jones, L., Progress Update on the Development of a User Adjustable Pole-piece, Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada, 29, (1), 2023, p1885-1886
Peters, J.J.P. and Mullarkey, T. and Hedley, E. and MÃŒller, K.H. and Porter, A. and Mostaed, A. and Jones, L., Electron counting detectors in scanning transmission electron microscopy via hardware signal processing, Nature Communications, 14, (1), 2023
Mullarkey, T. and Geever, M. and Peters, J.J.P. and Griffiths, I. and Nellist, P.D. and Jones, L., How Fast is Your Detector? The Effect of Temporal Response on Image Quality, Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada, 29, (4), 2023, p1402-1408
Bekkevold, J.M. and Peters, J.J.P. and Mullarkey, T. and Jones, L., Retrofitting and Reconfiguring Existing Microscopes for Digital DPC: an Accessible Approach to Low-Dose Phase Mapping, Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada, 29, (1), 2023, p1878-1879
Peters, J.J.P. and Reed, B.W. and Jimbo, Y. and Porter, A. and Masiel, D. and Jones, L., A New Low-dose STEM Imaging Mode with Probability Driven Intra-pixel Beam Blanking, Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada, 29, (1), 2023, p1754-1755
Quigley, F. and Downing, C. and McGuinness, C. and Jones, L., A Retrofittable Photoelectron Gun for Low-Voltage Imaging Applications in the Scanning Electron Microscope, Microscopy and Microanalysis, 29, (5), 2023, p1610-1617
Gambini, L. and Mullarkey, T. and Jones, L. and Sanvito, S., Machine-learning approach for quantified resolvability enhancement of low-dose STEM data, Machine Learning: Science and Technology, 4, (1), 2023
Mullarkey, Tiarnan and Peters, Jonathan JP and Moldovan, Grigore and Garel, Jonathan and Jones, Lewys, Fast Solid-state Segmented Detectors: Improvements and Implications for DPC-STEM, Microscopy and Microanalysis, 28, (S1), 2022, p2486--2487
Quigley, Frances and Downing, Clive and McGuinness, Cormac and Jones, Lewys, Benchmarking the Performance of a New Photoelectron Source, Microscopy and Microanalysis, 28, (S1), 2022, p2914--2916
Mullarkey, Tiarnan and Peters, Jonathan JP and Downing, Clive and Jones, Lewys, Using Your Beam Efficiently: Reducing Electron Dose in the STEM via Flyback Compensation, Microscopy and Microanalysis, 2022, p1--9
Annick De Backer, Sandra Van Aert, Christel Faes, Ece Arslan Irmak, Peter D. Nellist, Lewys Jones, Experimental reconstructions of 3D atomic structures from electron microscopy images using a Bayesian genetic algorithm, npj Computational Materials, 2022
Quigley, Frances and McBean, Patrick and O'Donovan, Peter and Jones, Lewys, Cost & Capability Compromises in STEM Instrumentation for Low-Voltage Imaging, Microscopy and Microanalysis, 2022, p1437 - 1443
McBean, Patrick and Murphy, Pat and Sagawa, Ryusuke and Jones, Lewys, The User Adjustable Pole-piece: Expanding TEM Functionality Without Compromise, Microscopy and Microanalysis, 28, (S1), 2022, p2636--2638
Mullarkey, Tiarnan and Peters, Jonathan JP and Geever, Matthew and Jones, Lewys, How Low Can You Go: Pushing the Limits of Dose and Frame-time in the STEM, Microscopy and Microanalysis, 28, (S1), 2022, p2218--2220
McBean, Patrick and Milne, Zachary and Kanthawar, Arjun and Hattar, Khalid and Jungjohann, Katherine and Jones, Lewys, Multiphysics Simulation for TEM Objective Lens Evaluation \& Design, Microscopy and Microanalysis, 28, (S1), 2022, p2494--2495
Ronan, O. and Roy, A. and Ryan, S. and Hughes, L. and Downing, C. and Jones, L. and Nicolosi, V., Templated Synthesis of SiO2Nanotubes for Lithium-Ion Battery Applications: An In Situ (Scanning) Transmission Electron Microscopy Study, ACS Omega, 2022
Quigley, Frances and Downing, Clive and McGuinness, Cormac and Jones, Lewys, Retrofitting a Photoelectron Source: Improving Resolution & Functionality, Microscopy and Microanalysis, 28, (S1), 2022, p2934--2935
Peters, Jonathan JP and Mullarkey, Tiarnan and Jones, Lewys, Improving the Noise Floor and Speed of Your Detector: A Modular Hardware Approach for Under $1000, Microscopy and Microanalysis, 28, (S1), 2022, p2904--2906
Peters, Jonathan JP and Mullarkey, Tiarnan and Gott, James A and Nelson, Elizabeth and Jones, Lewys, Interlacing in atomic resolution scanning transmission electron microscopy, arXiv preprint arXiv:2211.06954, 2022
Mishra, Tara P and Syaranamual, Govindo J and Deng, Zeyu and Chung, Jing Yang and Zhang, Li and Goodman, Sarah A and Jones, Lewys and Bosman, Michel and Grade{\v{c, Unlocking the Origin of Compositional Fluctuations in InGaN Light Emitting Diodes, Physical Review Materials, 5, 2021, p024605-
O'Leary, Colum M and Haas, Benedikt and Koch, Christoph T and Nellist, Peter D and Jones, Lewys, Increasing Spatial Fidelity and SNR of 4D-STEM using Multi-frame Data Fusion, Microscopy & Microanalysis, 2021
Jones, Lewys, The STEM: a nearly perfect Instrument, Book of Abstracts, Scanning Transmission Electron Microscopy, Advanced Characterization Methods for Materials Science Applications, Turkey, 2021
De Backer, Annick and Van Aert, Sandra and Nellist, Peter D. and Jones, Lewys, Procedure for 3D atomic resolution reconstructions using atom-counting and a Bayesian genetic algorithm, arXiv preprint arXiv:2105.05562, 2021
Mullarkey, T. and Downing, C. and Jones, L., Development of a Practicable Digital Pulse Read-Out for Dark-Field STEM, Microscopy and Microanalysis, 2021, p99 - 108
Luis Rangel DaCosta, Hamish G. Brown, Philipp M. Pelz, Alexander Rakowski, Natolya Barber, Peter O'Donovan, Patrick McBean, Lewys Jones, Jim Ciston, M.C. Scott, Colin Ophus, Prismatic 2.0 - Simulation software for scanning and high resolution transmission electron microscopy (STEM and HRTEM), Micron, 151, 2021
Practical Aspects of Quantitative and High-Fidelity STEM Data Recording in, Scanning Transmission Electron Microscopy, Advanced Characterization Methods for Materials Science Applications, CRC Press, 2021, pp1--40 , [Jones, Lewys]
De Wael, A. and De Backer, A. and Jones, L. and Varambhia, A. and Nellist, P.D. and Van Aert, S., Measuring Dynamic Structural Changes of Nanoparticles at the Atomic Scale Using Scanning Transmission Electron Microscopy, Physical Review Letters, 124, (10), 2020
Mullarkey, Tiarnan and Downing, Clive and Jones, Lewys, Retaining Precision at Low-dose and High-speed STEM Imaging Conditions, 26, (S2), 2020, pp2964--2966
Conroy, M., Moore, K., O'Connell, E., Jones, L., Downing, C., Whamore, R., Gruverman, A., Gregg, M., Bangert, U., Probing the Dynamics of Topologically Protected Charged Ferroelectric Domain Walls with the Electron Beam at the Atomic Scale, 26, (S2), 2020, pp3030-3032
O'Leary, Colum and Liberti, Emanuela and Martinez, Gerardo and Allen, Christopher and Huang, Chen and Rothmann, Mathias and Luo, Hui and Kim, Judy and Herz, Laura and Assender, Hazel and others, Focused-probe STEM Ptychography: Developments and Opportunities, 26, (S2), 2020, pp470--471
Haas, B., Schloz, M., Mittelberger, A., Lovejoy, T., Müller, J., Krivanek, O., Jones, L., Van Den Broek, W., Koch, C., Comparison of Ptychography vs. Center-of-Mass Analysis of Registered 4D-STEM Series, 26, (S2), 2020, pp1898-1900
McBean, Patrick and Oâ Mahony, David and Jones, Lewys, Development of a User Adjustable Pole-piece Gap Objective-lens, European Microscopy Congress, Scanning Transmission Electron Microscopy, Advanced Characterization Methods for Materials Science Applications, 2020, ppDOI--10
Van Aert, Sandra and De Backer, Annick and Fatermans, Jarmo and Friedrich, Thomas and Lobato, Ivan and O'Leary, Colum and Varambhia, Aakash and Altantzis, Thomas and Jones, Lewys and den Dekker, Arjan and others, 3D Atomic Scale Quantification of Nanostructures and their Dynamics Using Model-based STEM, 26, (S2), 2020, pp2606--2608
Spurgeon, S.R. and Ophus, C. and Jones, L. and Petford-Long, A. and Kalinin, S.V. and Olszta, M.J. and Dunin-Borkowski, R.E. and Salmon, N. and Hattar, K. and Yang, W.-C.D. and Sharma, R. and Du, Y. and Chiaramonti, A. and Zheng, H. and Buck, E.C. and Kovarik, L. and Penn, R.L. and Li, D. and Zhang, X. and Murayama, M. and Taheri, M.L., Towards data-driven next-generation transmission electron microscopy, Nature Materials, 2020
Mc Manus, John B and Ilhan, Cansu and Balsamo, Bastien and Downing, Clive and Cullen, Conor P and Stimpel-Lindner, Tanja and Cunningham, Graeme and Peters, Lisanne and Jones, Lewys and Mullarkey, Daragh and others, Synthesis of tungsten ditelluride thin films and highly crystalline nanobelts from pre-deposited reactants, Tungsten, 2, (3), 2020, p321--334
Van Aert, Sandra and De Backer, Annick and Jones, Lewys and Martinez, Gerardo T and B{\'e, Control of knock-on damage for 3D atomic scale quantification of nanostructures: Making every electron count in scanning transmission electron microscopy, Physical Review Letters, 122, (6), 2019, p066101-
Dominique Piché, Isabella Tavernaro, Jana Fleddermann, Juan G. Lozano, Aakash Varambhia, Mahon L. Maguire, Marcus Koch, Tomofumi Ukai, Armando J. Hernández Rodríguez, Lewys Jones, Frank Dillon, Israel Reyes Molina, Mai Mitzutani, Evelio R. González Dalmau, Toru Maekawa, Peter D. Nellist, Annette Kraegeloh, Nicole Grobert, Targeted T1 Magnetic Resonance Imaging Contrast Enhancement with Extraordinarily Small CoFe2O4 Nanoparticles, ACS Applied Materials & Interfaces, 2019, p6724-6740
De Backer, Annick and Lobato, Ivan and Altantzis, Thomas and B{\'e, Quantification of 3D Atomic Structures and Their Dynamics by Atom-Counting from an ADF STEM Image, 25, (S2), 2019, pp1808--1809
Tianyi Chen, Ieuan Ellis, Thomas J. N. Hooper, Emanuela Liberti, Lin Ye, Benedict T. W. Lo, Colum O"Leary, Alexandra A. Sheader, Gerardo T. Martinez, Lewys Jones, Ping-Luen Ho, Pu Zhao, James Cookson, Peter T. Bishop, Philip Chater, John V. Hanna, Peter Nellist, Shik Chi Edman Tsang, Interstitial Boron Atoms in the Palladium Lattice of an Industrial Type of Nanocatalyst: Properties and Structural Modifications, Journal of the American Chemical Society, 2019, p19616-19624
Negi, Devendra and Zeiger, Paul M and Jones, Lewys and Idrobo, Juan-Carlos and van Aken, Peter A and Rusz, J{\'a, Prospect for detecting magnetism of a single impurity atom using electron magnetic chiral dichroism, Physical Review B, 100, (10), 2019, p104434
Piché, D. and Tavernaro, I. and Fleddermann, J. and Lozano, J.G. and Varambhia, A. and Maguire, M.L. and Koch, M. and Ukai, T. and Hernández RodrÃguez, A.J. and Jones, L. and Dillon, F. and Reyes Molina, I. and Mitzutani, M. and González Dalmau, E.R. and Maekawa, T. and Nellist, P.D. and Kraegeloh, A. and Grobert, N., Targeted T
Nerl, H.C. and Pokle, A. and Jones, L. and MÃŒller-Caspary, K. and van den Bos, K.H.W. and Downing, C. and McCarthy, E.K. and Gauquelin, N. and Ramasse, Q.M. and Lobato, I. and Daly, D. and Idrobo, J.C. and Van Aert, S. and Van Tendeloo, G. and Sanvito, S. and Coleman, J.N. and Cucinotta, C.S. and Nicolosi, V., Self-Assembly of Atomically Thin Chiral Copper Heterostructures Templated by Black Phosphorus, Advanced Functional Materials, 29, (37), 2019
Conroy, Michele and Moore, Kalani and O'Connell, Eoghan and Courtney, Eileen and Harvey, Alan and Cochard, Charlotte and Guy, Joseph and McQuaid, Raymond and Jones, Lewys and Downing, Clive and others, Investigating Ferroelectric Domain and Domain Wall Dynamics at Atomic Resolution by TEM/STEM in situ Heating and Biasing, 25, (S2), 2019, pp1882--1883
Martinez, Gerardo T and Naginey, Timothy C and Jones, Lewys and O'Leary, Colum M and Pennycook, Timothy J and Nicholls, Rebecca J and Yates, Jonathan R and Nellist, Peter D, Direct Imaging of Charge Redistribution due to Bonding at Atomic Resolution via Electron Ptychography, arXiv preprint arXiv:1907.12974, 2019
Stevens, Andrew and Yang, Hao and Hao, Weituo and Jones, Lewys and Ophus, Colin and Nellist, Peter D and Browning, Nigel D, Subsampled STEM-ptychography, Applied Physics Letters, 113, (3), 2018, p033104-1 - 033104-5
Jones, L and Varambhia, A and Sawada, H and Nellist, PD, An optical configuration for fastidious STEM detector calibration and the effect of the objective-lens pre-field, Journal of microscopy, 2018
Jones, Lewys and Wang, Shuqiu and Hu, Xiao and ur Rahman, Shams and Castell, Martin R, Maximising the resolving power of the scanning tunneling microscope, Advanced structural and chemical imaging, 4, (1), 2018, p7
Cherns, David and Griffiths, Ian J and Jones, Lewys and Bishop, Douglas M and Lloyd, Michael A and McCandless, Brian E, Direct observation of high densities of antisite defects in Ag2ZnSnSe4, ACS Applied Energy Materials, 1, (11), 2018, p6260--6267
Rusz, Jan and Negi, Devendra and Jones, Lewys and Idrobo, Juan-Carlos, Towards Nanometer-Scale Three-Dimensional Magnetic Studies with Atomic Size Electron Vortex Beams, 24, (S1), 2018, pp918--919
Aakash Varambhia, Lewys Jones, Andrew London, Dogan Ozkaya, Peter D. Nellist, Sergio Lozano-Perez, Determining EDS and EELS partial cross-sections from multiple calibration standards to accurately quantify bi-metallic nanoparticles using STEM, Micron, 113, 2018, p69 - 82
Ellaby, Tom Henry and Aarons, Jolyon and Varambhia, Aakash and Jones, Lewys and Nellist, Peter and {\"O, Ideal vs real: Simulated annealing of experimentally derived and geometric platinum nanoparticles, Journal of Physics: Condensed Matter, 2018
Nellist, PD and Martinez, GT and Oâ Leary, C and Jones, L, Exploring the Limits of Focused-Probe STEM Ptychography, 24, (S1), 2018, pp190--191
Jones, Lewys and Downing, Clive, The MTF & DQE of Annular Dark Field STEM: Implications for Low-dose Imaging and Compressed Sensing, 24, (S1), 2018, pp478 - 479
Cherns, D. and Griffiths, I.J. and Jones, L. and Bishop, D.M. and Lloyd, M.A. and McCandless, B.E., Direct Observation of High Densities of Antisite Defects in Ag
Negi, Devendra and Jones, Lewys and Idrobo, Juan-Carlos and Rusz, J{\'a, Proposal for a three-dimensional magnetic measurement method with nanometer-scale depth resolution, Physical Review B, 98, (17), 2018, p174409
Jones, Lewys and Varambhia, Aakash and Beanland, Richard and Kepaptsoglou, Demie and Griffiths, Ian and Ishizuka, Akimitsu and Azough, Feridoon and Freer, Robert and Ishizuka, Kazuo and Cherns, David and others, Managing dose - damage-and data-rates in multi-frame spectrum-imaging, Microscopy, 2018
Jones, Lewys and Skylaris, Chris-Kriton and Nellist, Peter D and Varambhia, Aakash and Aarons, Jolyon and MacArthur, Katherine E and Ozkaya, Dogan and Sarwar, Misbah, From High-precision Imaging to High-performance Computing: Leveraging ADF-STEM Atom-counting and DFT for Catalyst Nano-metrology, 23, (S1), 2017, pp1880--1881
Sigurd Wenner, Lewys Jones, Calin D.Marioara, Randi Holmestad, Atomic-resolution chemical mapping of ordered precipitates in Al alloys using energy-dispersive X-ray spectroscopy., Micron (Oxford, England : 1993), 2017, p103-111
Hao Yang, Roberto dos Reis, Colin Ophus, Peter Ercius, Gerardo T. Martinez, Lewys Jones, Martin Huth, Martin Simson, Heike Soltau, Yukihito Kondo, Ryusuke Sagawa, Timothy J. Pennycook, Peter D. Nellist, Simultaneous imaging of light and heavy elements at atomic resolution using electron ptychography and fast pixelated detectors, Acta Crystallographica Section A Foundations and Advances, 73, (a1), 2017, pa168--a168
Lewys Jones, Sigurd Wenner, Magnus Nord, Per Harald, Ninive Ole Martin Løvvik, Randi Holmestad, Peter D.Nellist, Optimising multi-frame ADF-STEM for high-precision atomic-resolution strain mapping., Ultramicroscopy, 2017, p57-62
Lewys Jones and Chris-Kriton Skylaris and Peter D. Nellist and Aakash Varambhia and Jolyon Aarons and Katherine E. MacArthur and Dogan Ozkaya and Misbah Sarwar, From High-precision Imaging to High-performance Computing: Leveraging {ADF, 23, (S1), 2017, pp1880--1881
Kleibeuker, Jos{\'e, Route to achieving perfect B-site ordering in double perovskite thin films, NPG Asia Materials, 9, (7), 2017, pe406
Annelies De wael, Annick De Backer, Lewys Jones, Peter D. Nellist, Sandra Van Aert, Hybrid statistics-simulations based method for atom-counting from ADF STEM images, Ultramicroscopy, 177, 2017, p69--77
Walther, Thomas and Jones, Lewys, Preface to special issue on Microscopy of Semiconducting Materials 2017 (MSM-XX), Journal of microscopy, 268, (3), 2017, p221--224
Pennycook, Timothy J and Yang, Hao and Jones, Lewys and Cabero, Mariona and Rivera-Calzada, Alberto and Leon, Carlos and Varela, Maria and Santamaria, Jacobo and Nellist, Peter D, 3D elemental mapping with nanometer scale depth resolution via electron optical sectioning, Ultramicroscopy, 174, 2017, p27--34
Yang, Hao and dos Reis, Roberto and Martinez, Gerardo and Jones, Lewys and Simson, Martin and Soltau, Heike and Kondo, Yukihito and Sagawa, Ryusuke and Pennycook, Timothy and Nellist, Peter, Electron ptychographic phase imaging using fast pixelated detectors, Acta Cryst, 70, 2017, pC1349
Timothy J.Pennycook, Hao Yang, Lewys Jones, Mariona Cabero, Alberto, Rivera-Calzada, Carlos Leon, Maria Varela, Jacobo Santamari, Peter D.Nellist, 3D elemental mapping with nanometer scale depth resolution via electron optical sectioning., Ultramicroscopy, 2017, p27-34
Jolyon Aarons, Lewys Jones, Aakash Varambhia, Katherine E. MacArthur, Dogan Ozkaya, Misbah Sarwar, Chris-Kriton Skylaris, Peter D. Nellist, Predicting the Oxygen-Binding Properties of Platinum Nanoparticle Ensembles by Combining High-Precision Electron Microscopy and Density Functional Theory, Nano Letters, 2017, p4003-4017
Ian J. McPherson, Philip A. Ash, Lewys Jones, Aakash Varambhia, Robert M. J. Jacobs, Kylie A. Vincent, Electrochemical CO Oxidation at Platinum on Carbon Studied through Analysis of Anomalous in Situ IR Spectra, The Journal of Physical Chemistry C, 2017, p17176-17187
Varambhia, Aakash M and Jones, Lewys and De Backer, Annick and Van Aert, Sandra and Ozkaya, Dogan and Lozano-Perez, Sergio and Nellist, Peter D, Quantitative STEM of Catalyst Nanoparticles using ADF Imaging with Simultaneous EDS and EELS Spectroscopy., Proceedings of Microscopy & Microanalysis 2017, 23, (S1), 2017, pp1888--1889
Jones, Lewys and Wenner, Sigurd and Nord, Magnus Kristofer and Ninive, Per Harald and L{\o, Mapping the chemistry within, and the strain around, Al-alloy precipitates at atomic resolution by multi-frame scanning transmission electron microscopy, 2017
Martinez, GT and Pennycook, TJ and Naginey, TC and Jones, L and Yang, H and Yates, JR and Nicholls, RJ and Huth, M and Simson, M and Soltau, H and others, Towards a Direct Visualization of Charge Transfer in Monolayer Hexagonal Boron Nitride using a Fast Pixelated Detector in the Scanning Transmission Electron Microscope, Microscopy and Microanalysis, 23, (S1), 2017, p436--437
Wang, Yi and Jones, Lewys and Berkels, Benjamin and Sigle, Wilfried and van Aken, Peter A, Measuring the Cation and Oxygen Atomic Column Displacement at Picometer Precision, Proceedings of Microscopy & Microanalysis 2017, 23, (S1), 2017, pp1612--1613
Hao Yang, Ian MacLaren, Lewys Jones , Electron ptychographic phase imaging of light elements in crystalline materials using Wigner distribution deconvolution., Ultramicroscopy, 180, 2017, p173-179
Yang, Hao and MacLaren, Ian and Jones, Lewys and Martinez, Gerardo T and Simson, Martin and Huth, Martin and Ryll, Henning and Soltau, Heike and Sagawa, Ryusuke and Kondo, Yukihito and others, Electron ptychographic phase imaging of light elements in crystalline materials using Wigner distribution deconvolution, Ultramicroscopy, 180, 2017, p173--179
Nellist, Peter and Martinez, Gerardo and Pennycook, Timothy and Jones, Lewys and Yang, Hao and Huth, Martin and Simson, Martin and Soltau, Heike and Kondo, Yukihito and Sagawa, Ryusuke, Imaging charge transfer in crystals using electron ptychography, Foundations of Crystallography, 70, 2017, pC121
A. De Backer, L. Jones, I. Lobato, T. Altantzis, B. Goris, P. D. Nellist, S. Bals, S. Van Aert, Three-dimensional atomic models from a single projection using Z-contrast imaging: verification by electron tomography and opportunities, Nanoscale, 2017
Sagawa, Ryusuke and Yang, Hao and Jones, Lewys and Simson, Martin and Huth, Martin and Soltau, Heike and Nellist, Peter D and Kondo, Yukihito, Development of Fast Pixelated STEM Detector and its Applications using 4-Dimensional Dataset, Proceedings of Microscopy & Microanalysis 2017, 23, (S1), 2017, pp52--53
Hernandez-Maldonado, David and Yang, Hao and Jones, Lewys and Gr{\"o, STEM optical sectioning for imaging screw dislocation core structures, European Microscopy Congress 2016, 2016
Nellist, PD and Jones, L and Varambhia, A and De Backer, A and Van Aert, S and Ozkaya, D, Quantification of ADF STEM Image Data for Nanoparticle Structure and Strain Measurements, Microscopy and Microanalysis, 22, 2016, p896
Nellist, PD and Yang, H and Jones, L and Martinez, GT and Rutte, RN and Davis, BD and Pennycook, TJ and Simson, M and Huth, M and Soltau, H and others, The Use of Electron Ptychography to Implement Efficient Phase Imaging in STEM, Microscopy and Microanalysis, 22, 2016, p466
Sagawa, Ryusuke and Yang, Hao and Jones, Lewys and Simson, Martin and Huth, Martin and Soltau, Heike and Nellist, Peter D and Kondo, Yukihito, High-Speed Pixelated STEM Detector on Aberration Corrected Microscope, 2016
Yang, H., Rutte, R.N., Jones, L., Simson, M., Sagawa, R., Ryll, H., Huth, M., Pennycook, T.J., Green, M.L.H., Soltau, H., Kondo, Y., Davis, B.G., Nellist, P.D., Simultaneous atomic-resolution electron ptychography and Z-contrast imaging of light and heavy elements in complex nanostructures, Nature Communications, 7, 2016
Gonnissen, J., Batuk, D., Nataf, G.F., Jones, L., Abakumov, A.M., Van Aert, S., Schryvers, D., Salje, E.K.H., Direct Observation of Ferroelectric Domain Walls in LiNbO
Simson, M and Dunin-Borkowski, RE and Hartmann, R and Huth, M and Ihle, S and Jones, L and Kondo, Y and Migunov, V and Nellist, PD and Ritz, R and others, Pushing the Limits of Fast Acquisition in TEM Tomography and 4D-STEM, Microscopy and Microanalysis, 22, (S3), 2016, p512--513
Steven R. Spurgeon and Despoina M. Kepaptsoglou and Lewys Jones and Ryan B. Comes and Quentin M. Ramasse and Phuong-Vu Ong and Peter V. Sushko and Scott A. Chambers, Correlative Aberration-Corrected STEM-HAADF and STEM-EELS Analysis of Interface-Induced Polarization in LaCrO 3 -SrTiO 3 Superlattices, Microscopy and Microanalysis, 22, (S3), 2016, p1522--1523
Van Aert, Sandra and De Backer, Annick and Jones, Lewys and Martinez, Gerardo T and Goris, Bart and Altantzis, Thomas and B{\'e, Non-destructive nanoparticle characterisation using a minimum electron dose in quantitative ADF STEM: how low can one go?, European Microscopy Congress, 2016
Spurgeon, Steven R and Kepaptsoglou, Despoina M and Jones, Lewys and Comes, Ryan B and Ramasse, Quentin M and Ong, Phuong-Vu and Sushko, Peter V and Chambers, Scott A, Correlative Aberration-Corrected STEM-HAADF and STEM-EELS Analysis of Interface-Induced Polarization in LaCrO 3-SrTiO 3 Superlattices, Microscopy and Microanalysis, 22, 2016, p1522
David Hernandez-Maldonado and Hao Yang and Lewys Jones and Roman Grà ¶ger and Peter B Hirsch and Quentin M. Ramasse and Peter D Nellist, STEM Optical Sectioning for Imaging Screw Dislocations Core Structures in BCC Metals, Microscopy and Microanalysis, 22, (S3), 2016, p1932--1933
Sagawa, Ryusuke and Yang, Hao and Jones, Lewys and Simson, Martin and Huth, Martin and Soltau, Heike and Nellist, Peter and Kondo, Yukihito, Ptychographic phase reconstruction and aberration correction of STEM image using 4D dataset recorded by pixelated detector, European Microscopy Congress, 2016
Gonnissen, Julie and Batuk, Dmitry and Nataf, Guillaume F and Jones, Lewys and Abakumov, Artem M and Van Aert, Sandra and Schryvers, Dominique and Salje, Ekhard KH, Direct observation of ferroelectric domain walls in, 2016
Jones, L., Quantitative ADF STEM: Acquisition, analysis and interpretation, IOP Conference Series: Materials Science and Engineering, 109, (1), 2016
Comes, R.B., Spurgeon, S.R., Heald, S.M., Kepaptsoglou, D.M., Jones, L., Ong, P.V., Bowden, M.E., Ramasse, Q.M., Sushko, P.V., Chambers, S.A., Interface-Induced Polarization in SrTiO
Spurgeon, Steven and Kepaptsoglou, Despoina and Jones, Lewys and Comes, Ryan and Ramasse, Quentin and Ong, Phuong-Vu and Sushko, Peter and Chambers, Scott, Monochromated STEM-EELS Analysis of Interface-Induced Polarization in LaCrO3-SrTiO3 Superlattices, European Microscopy Congress, 2016
Nellist, Peter D and Yang, Hao and Martinez, Gerardo T and Jones, Lewys and Huth, Martin and Simson, Martin and Soltau, Heike and Kondo, Yukihito and Sagawa, Ryusuke and Pennycook, Timothy J, Fast pixelated detectors in STEM for quantitative phase imaging, 2016
Comes, Ryan B and Spurgeon, Steven R and Heald, Steve M and Kepaptsoglou, Despoina M and Jones, Lewys and Ong, Phuong Vu and Bowden, Mark E and Ramasse, Quentin M and Sushko, Peter V and Chambers, Scott A, Interface-Induced Polarization in SrTiO3-LaCrO3 Superlattices, Advanced Materials Interfaces, 3, (10), 2016
Varambhia, A.M., Jones, L., De Backer, A., Fauske, V.T., Van Aert, S., Ozkaya, D., Nellist, P.D., Quantifying a Heterogeneous Ru Catalyst on Carbon Black Using ADF STEM, Particle and Particle Systems Characterization, 33, (7), 2016, p438-444
Martinez, Gerardo T and Yang, Hao and Jones, Lewys and Simson, Martin and Huth, Martin and Soltau, Heike and Str{\"u, Study on the robustness of electron ptychography for phase imaging in the STEM using fast pixelated detectors, European Microscopy Congress, 2016
Salih, J.M., Wang, L.Q., Ramasse, Q.M., Jones, L., Barthel, J., Craven, A.J., Maclaren, I., Maghemite-like regions at the crossing of two antiphase boundaries in doped BiFeO3, Materials Science and Technology (United Kingdom), 32, (3), 2016, p242-247
Vogt, T., Blom, D.A., Jones, L., Buttrey, D.J., ADF-STEM Imaging of Nascent Phases and Extended Disorder Within the Mo"V"Nb"Te"O Catalyst System, Topics in Catalysis, 59, (17-18), 2016, p1489-1495
Pich{\'e, Atomic resolution electron microscopy of cobalt ferrite nanoparticles, European Microscopy Congress, 2016
Nellist, Peter and Yang, Hao and Jones, Lewys and Martinez, Gerardo and Rutte, Reida and Davis, Benjamin and Pennycook, Timothy and Simson, Martin and Huth, Martin and Soltau, Heike and others, Efficient and quantitative phase imaging in two-and three-dimensions using electron ptychography in STEM, European Microscopy Congress 2016, 2016
Simson, Martin and Dunin-Borkowski, Rafal E and Hartmann, Robert and Huth, Martin and Ihle, Sebastian and Jones, Lewys and Kondo, Yukihito and Migunov, Vadim and Nellist, Peter D and Ritz, Robert and others, Extending the Limits of Fast Acquisition in TEM Tomography and 4D-STEM, European Microscopy Congress, 2016
Jones, Lewys and Varambhia, Aakash and Wenner, Sigurd and Nord, Magnus and Ninive, Per Harald and L{\o, Nano-scale strain measurements from high-precision ADF STEM, European Microscopy Congress 2016, 2016
Varambhia, Aakash and Jones, Lewys and De Backer, Annick and Fauske, Vidar and Van Aert, Sandra and Ozkaya, Dogan and Lozano-Perez, Sergio and Nellist, Peter, Experiment design for quantitative dark field imaging and spectroscopy of catalyst nanoparticles using Scanning Transmission Electron Microscopy (STEM), European Microscopy Congress, 2016
Hernandez-Maldonado, David and Yang, Hao and Jones, Lewys and Gr{\"o, STEM Optical Sectioning for Imaging Screw Dislocations Core Structures in BCC Metals, Microscopy and Microanalysis, 22, 2016, p1932
Jones, Lewys and Varambhia, Aakash and Kepaptsoglou, Demie and Ramasse, Quentin and Freer, Robert and Azough, Feridoon and Lozano-Perez, Sergio and Beanland, Richard and Nellist, Peter, New Opportunities in multi-frame STEM Spectroscopy \& Fractional Beam-current EELS, European Microscopy Congress, 2016
Yang, H and Jones, L and Rutte, RN and Davis, BD and Pennycook, TJ and Simson, M and Huth, M and Soltau, H and Str{\"u, Phase Imaging in STEM Allowing for Post-Acquisition Aberration Correction and 3D Optical Sectioning using Ptychography Wigner-Distribution Deconvolution, Microscopy and Microanalysis, 22, 2016, p508
Yang, H and Lozano, JG and Pennycook, TJ and Jones, L and Hirsch, PB and Nellist, PD, Imaging screw dislocations at atomic resolution by aberration-corrected electron optical sectioning, Nature communications, 6, 2015
Yang, Hao and Lozano, Juan G and Pennycook, Timothy J and Jones, Lewys and Hirsch, Peter B and Nellist, Peter D, STEM Optical Sectioning for Imaging Screw Displacements in Dislocation Core Structures, Microscopy and Microanalysis, 21, 2015, p1927
Yang, Hao and Jones, Lewys and Ryll, Henning and Simson, Martin and Soltau, Heike and Kondo, Yukihito and Sagawa, Ryusuke and Banba, Hiroyuki and Pennycook, Timothy J and Nellist, Peter D, High efficiency phase contrast imaging in STEM using fast direct electron pixelated detectors, Microscopy and Microanalysis, 21, 2015, p2303
Lewys Jones, Katherine E. MacArthur, Jolyon Aarons, Chris-Kriton Skylaris, Misbah Sarwar, Dogan Ozkaya, Peter D. Nellist, Towards Statistically Representative Atomic Resolution 3D Nano-metrology for Materials Modelling and Catalyst Design, Microsc Microanal, 21, (S3), 2015, p2197--2198
Ian MacLaren, Hao Yang, Lewys Jones, Peter D. Nellist, Henning Ryll, Martin Simson, Heike Soltau, Yukihito Kondo, Ryusuke Sagawa, Hiroyuki Banba, Atomic resolution ptychographic phase contrast imaging of polar-ordered structures in functional oxides, Microsc Microanal, 21, (S3), 2015, p1221--1222
Spurgeon, S.R., Balachandran, P.V., Kepaptsoglou, D.M., Damodaran, A.R., Karthik, J., Nejati, S., Jones, L., Ambaye, H., Lauter, V., Ramasse, Q.M., Lau, K.K.S., Martin, L.W., Rondinelli, J.M., Taheri, M.L., Polarization screening-induced magnetic phase gradients at complex oxide interfaces, Nature Communications, 6, 2015
Martinez, G.T., Jones, L., De Backer, A., Béché, A., Verbeeck, J., Van Aert, S., Nellist, P.D., Quantitative STEM normalisation: The importance of the electron flux, Ultramicroscopy, 159, (P1), 2015, p46-58
Pennycook, T.J., Lupini, A.R., Yang, H., Murfitt, M.F., Jones, L., Nellist, P.D., Efficient phase contrast imaging in STEM using a pixelated detector. Part 1: Experimental demonstration at atomic resolution, Ultramicroscopy, 151, 2015, p160-167
Simson, M and Ryll, H and Banba, H and Hartmann, R and Huth, M and Ihle, S and Jones, L and Kondo, Y and Muller, K and Nellist, PD and others, 4d-stem imaging with the PNCCD (s) tem-camera, Microscopy and Microanalysis, 21, (S3), 2015, p2211--2212
Yang, H., Jones, L., Ryll, H., Simson, M., Soltau, H., Kondo, Y., Sagawa, R., Banba, H., MacLaren, I., Nellist, P.D., 4D STEM: High efficiency phase contrast imaging using a fast pixelated detector, Journal of Physics: Conference Series, 644, (1), 2015
De Backer, A., Martinez, G.T., MacArthur, K.E., Jones, L., Béché, A., Nellist, P.D., Van Aert, S., Dose limited reliability of quantitative annular dark field scanning transmission electron microscopy for nano-particle atom-counting, Ultramicroscopy, 151, 2015, p56-61
Jones, Lewys and Yang, Hao and Pennycook, Timothy J and Marshall, Matthew SJ and Van Aert, Sandra and Browning, Nigel D and Castell, Martin R and Nellist, Peter D, Smart Align - a new tool for robust non-rigid registration of scanning microscope data, Advanced Structural and Chemical Imaging, 1, (1), 2015, p1--16
Varambhia, A.M., Jones, L., Nellist, P.D., Lozano-Perez, S., Ozkaya, D., Quantification of a heterogeneous ruthenium catalyst on carbon-black using ADF imaging, Journal of Physics: Conference Series, 644, (1), 2015
Jones, Lewys and Beanland, Richard and Lozano-Perez, Sergio and Baba-kishi, Karim and Nellist, Peter D, Improving the SNR of Atomic Resolution STEM EELS \& EDX Mapping while Reducing Beam-damage by using Non-rigid Spectrum-image Averaging, Microscopy and Microanalysis, 21, 2015, p1215
Simson, M and Ryll, H and Banba, H and Hartmann, R and Huth, M and Ihle, S and Jones, L and Kondo, Y and Muller, K and Nellist, PD and others, 4D-STEM imaging with the pnCCD (S) TEM-camera, Microscopy and Microanalysis, 21, 2015, p2211
De Backer, A., De wael, A., Gonnissen, J., Martinez, G.T., Béché, A., MacArthur, K.E., Jones, L., Nellist, P.D., Van Aert, S., Quantitative annular dark field scanning transmission electron microscopy for nanoparticle atom-counting: What are the limits?, Journal of Physics: Conference Series, 644, (1), 2015
Lewys Jones, Hao Yang, Katherine E. MacArthur, Henning Ryll, Martin Simson, Heike Soltau, Yukihito Kondo, Ryusuke Sagawa, Hiroyuki Banba, Peter D. Nellist, Opportunities in Angularly Resolved Dark-field STEM using Pixelated Detectors, Microsc Microanal, 21, (S3), 2015, p2411--2412
Timothy J. Pennycook, Lewys Jones, Henrik Pettersson, Valeria Nicolosi, Peter D. Nellist, Probing Atomic Scale Dynamics with STEM, Microscopy and Microanalysis, 20, (S3), 2014, p104--105
Lewys Jones, Peter D. Nellist, Testing the accuracy of the two-dimensional object model in HAADF STEM, Micron, 63, 2014, p47--51
Lewys Jones, Scan-noise and Drift Correction in the STEM, Micros. Today, 22, (03), 2014, p40--41
Macarthur, K.E., Jones, L.B., Nellist, P.D., How flat is your detector? Non-uniform annular detector sensitivity in STEM quantification, Journal of Physics: Conference Series, 522, (1), 2014
Jones, L., Nellist, P.D., Three-dimensional optical transfer functions in the aberration-corrected scanning transmission electron microscope, Journal of Microscopy, 254, (2), 2014, p47-64
Prabakaran, Arunvinay and Dillon, Frank and Melbourne, Jodie and Jones, Lewys and Nicholls, Rebecca J and Holdway, Phil and Britton, Jude and Koos, Antal A and Crossley, Alison and Nellist, Peter D and others, WS2 2D nanosheets in 3D nanoflowers, Chemical Communications, 50, (82), 2014, p12360--12362
Lewys Jones, Gerardo T. Martinez, Armand Béché, Sandra Van Aert, Peter D. Nellist, Getting the Best from an Imperfect Detector - an Alternative Normalisation Procedure for Quantitative HAADF STEM, Microscopy and Microanalysis, 20, (S3), 2014, p126--127
MacArthur, Katherine E and Jones, Lewys B and Lozano-Perez, S and Ozkaya, D and Nellist, PD, Quantification of Pt/Ir Catalyst Nanoparticles using ADF STEM, 18th International Microscopy Congress, Prague, Czech Republic, 2014
Macarthur, K.E., Jones, L.B., Lozano-Perez, S., Ozkaya, D., Nellist, P.D., Structural quantification of nanoparticles by HAADF STEM, Journal of Physics: Conference Series, 522, (1), 2014
Prabakaran, A., Dillon, F., Melbourne, J., Jones, L., Nicholls, R.J., Holdway, P., Britton, J., Koos, A.A., Crossley, A., Nellist, P.D., Grobert, N., WS
Timothy J. Pennycook, Lewys Jones, Mariona Cabero, Alberto Ribera-Calzada, Carlos Leon, Maria Varela, Jacobo Santamaria, Peter D. Nellist, Optical Sectioning with Atomic Resolution Spectroscopy, Microscopy and Microanalysis, 20, (S3), 2014, p584--585
Jones, L., Nellist, P.D., Two-dimensional object functions and three-dimensional illumination functions: Their validity, interaction and utility, Journal of Physics: Conference Series, 522, (1), 2014
Lewys Jones, Vidar T. Fauske, Katherine E. MacArthur, Antonius T. J. van Helvoort, Peter D. Nellist, Visualising the Three-dimensional Morphology and Surface Structure of Metallic Nanoparticles at Atomic Resolution by Automated HAADF STEM Atom Counting, Microscopy and Microanalysis, 20, (S3), 2014, p60--61
Jones, Lewys and Martinez, Gerardo T and B{\'e, Getting the Best from an Imperfect Detector, 2014
Jones, L., Macarthur, K.E., Fauske, V.T., Van Helvoort, A.T.J., Nellist, P.D., Rapid estimation of catalyst nanoparticle morphology and atomic-coordination by high-resolution Z-contrast electron microscopy, Nano Letters, 14, (11), 2014, p6336-6341
Timothy J. Pennycook, Andrew R. Lupini, Lewys Jones, Peter D. Nellist, Maximum Efficiency STEM Phase Contrast Imaging, Microscopy and Microanalysis, 20, (S3), 2014, p382--383
Pennycook TJ, Jones L, Pettersson H, Coelho J, Canavan M, Mendoza-Sanchez B, Nicolosi V, Nellist PD, Atomic scale dynamics of a solid state chemical reaction directly determined by annular dark-field electron microscopy., Scientific reports, 4, 2014, p7555
Pennycook, Timothy J and Jones, Lewys and Pettersson, Henrik and Nicolosi, Valeria and Nellist, Peter D, Atomic Scale Dynamics of a Manganese Oxide Phase Change Observed with STEM, Microscopy and Microanalysis, 19, (S2), 2013, p1876--1877
Pennycook, Timothy J and Jones, Lewys and Nellist, Peter D, Position-Sensitive STEM Detectors for Ð igh-Sensitivity Phase Detection, Microsc. Microanal, 19, (2), 2013, p1181
Jones, Lewys and Nellist, Peter D, Advances in 2D, 3D and 4D STEM Image Data Analysis, Microscopy and Microanalysis, 19, (S2), 2013, p770--771
, Identifying and Correcting Scan Noise and Drift in the Scanning Transmission Electron Microscope, 2013
Jones, Lewys, Applications of focal-series data in scanning-transmission electron microscopy, 2013
Pennycook, Timothy J and Jones, Lewys and Cabero, Mariona and Ribera-Calzada, Alberto and Leon, Carlos and Varela, Maria and Santamaria, Jacobo and Nellist, Peter D, Depth Sensitive Atomic Resolution Spectroscopy and Imaging of Highly Strained YSZ/STO Epitaxial Heterostructures, Microscopy and Microanalysis, 19, (S2), 2013, p538--539
Jones, Lewys and Nellist, Peter D, Post-processing of STEM Data for Instability and Drift Compensation, 15th European Microscopy Congress, 16th-21st September 2012, 2, 2012, pp469--470
Jones, Lewys and Nellist, Peter D, Focal Series Reconstruction in Annular Dark-Field STEM, Microscopy and Microanalysis, 18, (Supplement 2), 2012, p1214--1215
, STEM Image Post-processing for Instability and Aberration Correction for Transfer Function Extension, 2012
, Three-Dimensional Crystal Structure Mapping by Diffractive Scanning Confocal Electron Microscopy (SCEM), 2012
Jones, L and Nellist, PD, A three-dimensional investigation of the STEM-probe/sample interaction by annular dark-field focal series, 15th European Microscopy Congress, 16th-21st September 2012, 2, 2012, pp459--460
Jones, L., Nellist, P.D., Post-processing of STEM Data for Instability and Drift Compensation, Microscopy and Microanalysis, 18, (S2), 2012, p1232-1233
Jones, Lewys, Damage Characterisation and Modelling of Rigid Polyurethane Foam, 2009
Research Expertise
Recognition
Representations
EU-ESTEEM3 Scientific Review Committee
Irish Universities Association (IUA) Infrastructure Working Group
EU Commission H2020 Reviewer & Rapporteur (INFRADEV)
Czech Science Foundation Rapporteur
EPSRC Scientific Proposal Reviewer
Editorial Board Member, Royal Society Publishing Philosophical Transactions A
Associate Editor, Advanced Structural & Chemical Imaging
Editor of MSI Special Volume of Microscope & Microanalysis
Awards and Honours
Trinity Innovation Awards "Ones to Watch" Category
Royal Society & SFI University Research Fellowship Awardee
Microanalysis Society (MAS) Macres Award for Best Instrumentation Paper 2018
Microscopy & Microanalysis Outstanding Reviewer Award
Oxford Instruments 'Eric Samuel Memorial Award' Postdoctoral Scholarship
EMS Outstanding Paper Award for 2015 - Materials Sciences Category
Winner International Federation of Societies for Microscopy (IFSM) "Young Scientist Award"
International Microscopy Congress (IMC) 2014 European Scholarship Winner
Birks Award for Best Contributed Paper at M&M2013
Microscopy Society of America (MSA) 'M&M2013 Best Poster - Instrumentation Category'
Microanalysis Society (MAS) 'M&M2012 - Distinguished Scholar Award'
Microscopy Society of America (MSA) 'M&M2012 Best Poster - Instrumentation Category'
Oxford Materials 'Hetherington Prize for Best Postgraduate Research Presentation'
Memberships
President of the Microscopy Society of Ireland
Member of the Microscopy Society of Ireland
Fellow of the Royal Microscopical Society
Member of Institute of Physics
Early Career (Associate) Member of the Institute of Physics
Member of the Royal Microscopical Society