National X-ray Research Laboratory

The NXRL welcomes enquiries from companies seeking advanced X-ray characterisation to support materials development, process optimisation, quality investigation and research-led innovation. The facility's complementary diffraction, scattering and fluorescence techniques can connect elemental composition with structure across several length scales.

Industrial engagement begins with a technical discussion. NXRL staff review the research question, sample type, required outputs and suitable measurement route before a scope of work is agreed. Confidentiality, intellectual property arrangements, turnaround time, level of analysis and charges are confirmed for each project before samples are submitted.

Potential support for industrial projects

• Initial feasibility discussion and selection of the most appropriate X-ray technique
• Comparative measurements for raw materials, formulations, coatings, components or process variants
• Phase, structural, thin-film, nanoscale and elemental characterisation using the relevant NXRL system
• Measurement planning and data interpretation at a level agreed during project scoping
• Collaborative or confidential work, subject to Trinity's current commercial and research procedures

The NXRL operates an open-access model for academic and industrial users in Ireland and internationally. Access rates vary by user and project type and are agreed case by case following technical review. Through these partnerships, the facility supports internationally competitive materials research with benefits for Ireland's economy and society.

The NXRL brings together five complementary X-ray systems. The most appropriate instrument and measurement geometry depend on the material, sample form and scientific question. Prospective users should discuss their project with NXRL staff before preparing or submitting samples.

POWDER X-RAY DIFFRACTION (POWDER XRD)

System: Bruker D8 ADVANCE

The D8 ADVANCE is the NXRL's principal powder X-ray diffraction system. It is configured for Bragg-Brentano reflection, transmission and capillary measurements and can accommodate a wide range of polycrystalline materials. Its Cu X-ray source, focusing optics and LYNXEYE XE-T detector support efficient data collection for routine phase analysis as well as more demanding structural studies.

The system also includes an Anton Paar TTK 600 chamber for controlled-temperature experiments. With liquid-nitrogen cooling, the chamber has a specified operating range from -190 °C to 600 °C; with compressed-air cooling, the specified range is -20 °C to 600 °C. Dedicated reflection and transmission holders are included for suitable battery and other non-ambient studies. In situ measurements under nitrogen or argon can also be arranged. All proposed non-ambient experiments require prior discussion with NXRL staff and an approved risk assessment.

SAMPLE GUIDANCE

Suitable forms may include powders, compacted or flat polycrystalline specimens, films suitable for conventional powder geometry, and samples loaded into compatible capillaries or non-ambient holders. Required quantity and preparation depend on absorption, crystallinity, geometry and the analytical objective. Air-sensitive, reactive, hazardous and other restricted samples are not routinely accepted; any proposed work requires prior discussion and an approved risk assessment.

WAVELENGTH-DISPERSIVE X-RAY FLUORESCENCE (WDXRF)

System: Bruker S8 TIGER Series 2

The S8 TIGER Series 2 is a sequential wavelength-dispersive X-ray fluorescence (WDXRF) spectrometer for non-destructive elemental analysis. The NXRL configuration combines a 4 kW rhodium X-ray source, dedicated analyser crystals and two detectors for qualitative and quantitative analysis across a broad elemental range, subject to sample matrix, preparation and validated calibration.

The system is optimised for standardless analysis of varied sample types and for thin coated films. It includes XRF2 mapping with selectable 0.3 mm and 1.25 mm measurement masks over an active sample area up to 34 mm in diameter. QUANT-EXPRESS software supports standardless screening, while ML plus supports suitable single-layer and multilayer composition and thickness modelling. Accuracy and detection limits depend on the material, preparation, calibration and measurement conditions.

For suitable solid samples, the NXRL can provide milling and pelletising to prepare pressed pellets for WDXRF analysis. Preparation requirements should be agreed before samples are submitted.

SAMPLE GUIDANCE

Measurement quality depends strongly on surface flatness, homogeneity, particle size, density and preparation. Pressed pellets, coatings and flat solids must meet the dimensions and preparation requirements agreed with NXRL staff. Direct measurements of liquids, loose powders and volatile materials are not routinely offered. Hazardous or otherwise restricted materials require prior discussion and an approved risk assessment.

THIN-FILM AND HIGH-RESOLUTION X-RAY DIFFRACTION (HRXRD)

System: Bruker D8 DISCOVER

The D8 DISCOVER is a flexible materials-research diffractometer configured for thin films, coatings, wafers and other flat specimens. Its Cu X-ray source, TRIO optics, vertical ATLAS goniometer, motorised Eulerian cradle and non-coplanar detector arm support high-resolution, grazing-incidence, in-plane and out-of-plane measurements without remounting the sample for many workflows.

An EIGER2 R 500K hybrid photon-counting area detector enables 0D, 1D and 2D data acquisition. The system can be configured for high-resolution X-ray diffraction, X-ray reflectivity, reciprocal-space mapping, grazing-incidence diffraction, texture and residual-stress measurements, and X-Y mapping. The appropriate method depends on the material, substrate, film thickness, expected crystallinity and scientific question.

SAMPLE GUIDANCE

Best results are obtained from flat samples with a known substrate, layer sequence and approximate thickness. The supplied small-sample holder is specified for samples up to 25 mm × 25 mm and 1 mm thick. Other specimens may be accommodated subject to geometry, weight, flatness and collision-clearance checks; confirm the dimensions with NXRL staff before submission.

SMALL-ANGLE X-RAY SCATTERING (SAXS)

Bruker N8 HORIZON

The N8 HORIZON is a dedicated laboratory small-angle X-ray scattering system for investigating nanoscale structure in materials that may be non-crystalline, partially ordered or heterogeneous. SAXS in transmission probes particles, pores and phase-separated domains, while GISAXS provides surface and near-surface sensitivity for suitable films and nanostructured substrates. A complementary WAXS detector can collect information from shorter-range crystalline order.

The NXRL configuration uses a Cu microfocus source with Montel optics and a large-area VANTEC-500 detector. It includes a motorised GISAXS stage and sample environments for solids, powders, liquids, flow measurements, capillaries and pastes. Heating and cooling accessories supplied with the system cover operation from -30 °C to 120 °C and from room temperature to 300 °C. Availability for a specific project should be confirmed with NXRL staff during technical scoping.

SAMPLE GUIDANCE

Provide the anticipated structural length scale, composition, sample form and a suitable background or solvent blank. Quantitative SAXS may require concentration series, accurate thickness/path length, matched backgrounds and independent knowledge of the system. GISAXS projects require flat substrates and advance discussion of sample size, orientation and expected feature dimensions.

SINGLE-CRYSTAL X-RAY DIFFRACTION (SCXRD)

Bruker D8 VENTURE

The D8 VENTURE is a dual-source single-crystal X-ray diffractometer for three-dimensional structure determination. It combines molybdenum and copper microfocus sources with HELIOS optics, a kappa goniometer and a PHOTON III C14 area detector. This provides flexibility for small-molecule chemical crystallography and, by prior agreement, suitable biological or macromolecular crystal-screening and data-collection workflows.

An Oxford Cryosystems Cryostream 800 Plus provides sample temperatures from 80 K to 500 K and includes automatic liquid-nitrogen refill. APEX software supports experiment planning, data collection and reduction for chemical crystallography, while PROTEUM can support suitable macromolecular workflows. Because NXRL staff do not currently provide specialist macromolecular crystallography support, these projects are considered only when the requester has relevant experience and the work has been agreed with NXRL staff in advance. Crystal quality, dimensions, diffraction strength, unit-cell size and sensitivity to handling determine whether a complete structure can be obtained.

SAMPLE GUIDANCE

Submit representative crystals with the expected molecular formula, solvent information, air, moisture or light sensitivity, hazard information and scientific objective. Visual crystal quality does not guarantee diffraction quality. Fragile, reactive, unstable, pressurised or hazardous samples are not routinely accepted and require prior discussion, an approved risk assessment and agreement on mounting and handling.

The NXRL welcomes enquiries from Trinity researchers, external academic users and industry. All five systems are currently available. Access is provided through staff-operated measurements or, where appropriate, trained-user operation. Specialist staff can advise on technique selection, sample preparation, measurement design and the level of analysis required.

Liquids, loose powders, air-sensitive, radioactive, biological and other hazardous materials are not routinely accepted. Any proposed work involving these materials requires prior discussion and an approved risk assessment. Advanced data interpretation and report preparation may be available by agreement and are scoped case by case.

Information to provide

• Research question and the decision the measurement should support
• Sample composition, form, dimensions and approximate number of samples
• Known hazards, handling restrictions and stability concerns
• Technique or instrument requested, if known
• Required outputs, analysis level and target timescale
• Whether the work is academic, collaborative or commercial/confidential

Contact and booking