ZEISS Sigma 300 VP

The ZEISS Sigma 300 VP is a high-performance field-emission scanning electron microscope (FE-SEM) featuring Gemini 1 optics, variable-pressure capabilities, and a large specimen chamber, designed for high-resolution imaging and advanced nano-analysis of nonconductive and challenging samples.

Technical Specifications

• Electron Source: Schottky thermal field emitter.
• Accelerating Voltage: 0.02 kV to 30 kV.
• Resolution: 1nm at 15 kV, 1.6 nm at 1 kV
• Variable Pressure Range: 2 Pa to 133 Pa.