Focused Ion Beam (FIB) Technologies
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Zeiss ORION Nanofab
Installed in November 2015, the ORION Nanofab is the only instrument of its kind in Ireland. Learn more...
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Zeiss AURIGA Focused Ion Beam
The Carl Zeiss Auriga Focused Ion Beam (FIB) system is a versatile microscope tool for failure analysis, construction analysis, investigating embedded particles and features... Learn more...
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ZEISS Sigma 300 VP
The ZEISS Sigma 300 VP is a high-performance field-emission scanning electron microscope (FE-SEM) featuring Gemini 1 optics. Learn more...