The event was attended by researchers, engineers, and students who gained practical insights into micro- to atomic‑scale analytical methods, learned directly from experts at Bruker and AMBER, experienced cutting-edge instrumentation in action and had the opportunity to analyse their own samples during hands‑on sessions
AMBER and CRANN Executive Director Dr Lorraine Byrne opened the 2 day event, followed by addresses from Heath Young of Bruker and AMBER PIs Professor Wolfgang Schmitt and Professor Valeria Nicolosi, both of Trinity College Dublin.
Day 1 Talks included:
- “Thin-film X-ray Diffraction Techniques” - Fernando Rinaldi, Bruker AXS SE
- “Mapping Material Synthesis by Statistical Analysis” - Prof. Peter Dunne, TCD
- “An Introduction to X-ray Fluorescence Applications” - Archie Harris, Bruker UK Limited
Followed by: Lab Carousel Sessions and demonstrations of the X-Ray Lab, Advanced Microscopy Lab, EBSD, TEM EDX & SEM EDX
Day 2 Talks included:
- “X-ray diffraction and fluorescence of metal oxide thin films” - Dr. Brian Walls
- “Energy Dispersive X-Ray Spectroscopy in the Electron Microscope, Challenges and Possibilities” - Dr. Meiken Falke, Bruker
- “Unraveling Structure–Performance Relationships in 2D Battery Materials” - Prof. Valeria Nicolosi, TCD
- “Low-kV EBSD made powerful: Real Signal Integrity, High-Speed, High-Resolution Mapping” - Dr. Laurie Palasse, Bruker
- “TKD and the challenges of nanocrystalline metal films” - Prof. John Boland, TCD
Followed by the final Lab Carousel Sessions and demonstrations of the X-Ray Lab, Advanced Microscopy Lab, EBSD, TEM EDX & SEM EDX.
This was a fantastic event enabling research and industry to collaborate and provide practical experiences for researchers of all levels and varying disciplines. Many thanks to those who gave their time and expertise on the day and from the AMBER and CRANN side, particular thanks to Megan Canavan, Cathal Mc Auley and Jhonattan Frank Baez Vasquez for their work in planning the event.