Photonics

The Photonics Research Laboratory at CRANN, Trinity College Dublin, is an established optical research center and a key technology platform for Ireland.

It combines unique femtosecond laser systems with different repetition rates and tunability from UV to mid-IR, a Raman Spectroscope, Scanning Near-field Optical Microscope and a Fluorescence Lifetime Imaging Microscope. At CRANN we are carrying out research related to nonlinear dynamics, nonlinear optics, ultrafast optics, near-field optics and surface Plasmon resonance.

For more information on the CRANN Photonics Laboratory and related projects please email Prof John Donegan, jdonegan AT tcd.ie.

System Specifications:

CW 532 nm.

80MHz, <130 fs, 700 nm-980 nm.

Pumped 500 mW@ 832 nm, SHG: 70 mW @ 416 nm.

THG: 25 mW@ 277 nm.

80 MHz, <130 fs, 525 nm-750 nm.

80 MHz, <130 fs, 1 050 nm-1600 nm (Signal).

80 MHz, <130 fs, 1600 nm-2600 nm (Idler).

System Specifications:

CW 532 nm.

780 nm-820 nm, <130 fs.

500 mW@800 nm, <130 fs.

White light output.

SHG output, 400 nm, <130 fs.

Signal 480 nm-700 nm, <130 fs.

Idler 933 nm-2300 nm, <130 fs.

Signal 1200 nm-1600 nm, <130 fs

Idler 1600 nm-2400 nm, <130 fs.

2.55 µm to >10 µm.

System Specifications:

780 nm-820 nm, <130 fs.

800nm, Repetition Rates @1 kHz, Pulse Energy >1 mJ.

SNOM:

SNOM:
  Scanning by sample Scanning by probe

Scan range

100x100x10 µm

100x100x7 µm

Non-linearity, XY

0.1 % (typically)

<0.15 %

Noise level, Z

<0.2 nm (typically)

0.04 nm (typically)

Noise level, XY

<0.5 nm (typically)

0.2 nm (typically)

Quartz tuning fork base frequency 190 kHz  

Optical fiber diameter

90 µm (for 480 nm-550 nm)

 

Aperture diameter     

< 100 nm

 

 

AFM:

Raman spectroscope:
Wavelength coverage: ~ 100 cm-1 to 9000 cm-1. Laser options: 488 nm Argon Iron Laser &, 532 nm, & 633 nm Helium-Neon Laser. Three grating options: 1200/mm, 2400/mm and 3000/mm. Spectral resolution: ~ 1 cm-1(depending on configuration).
  Scanning by sample Scanning by probe
Scan range 100x100x10 µm 100x100x10 µm
Non-linearity, XY 0.1 % (typically) <0.15 %
Noise level, Z <0.04 nm (typically) 0.06 nm (typically)

Noise level, XY

<0.2 nm (typically)

0.1 nm (typically)