The nature of the Argon beam itself reduces the likelihood of implantation in the sample, rendering a cleaner image following examination under TEM. Capable of accelerating potentials as low as 50eV, the 1040 NanoMill offers unparalleled control over the ions produced in the system.
It also features a liquid nitrogen cooling system to ensure that temperature sensitive specimens can be milled without fear of degradation.
Technical Specifications
- Ion beam currents range from 0.1 - 300µA
- Secondary Electron (SE) detector
- Accelerating voltage range from 50eV-2000eV