Focused Ion Beam (FIB) Technologies
Zeiss ORION Nanofab
Installed in November 2015, the ORION Nanofab is the only instrument of its kind in Ireland. Learn more...
Zeiss AURIGA Focused Ion Beam
The Carl Zeiss Auriga Focused Ion Beam (FIB) system is a versatile microscope tool for failure analysis, construction analysis, investigating embedded particles and features... Learn more...
FEI Strata 235DB
The FEI Strata 235DB is a dual beam FIB/ SEM system equipped with multiple electron detectors, and also includes a secondary ion detector. Learn more...