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You are here Instrumentation > Transmission Electron Microscopes (STEM/TEM) > JEOL 2100 LaB TEM

JEOL 2100 LaB TEM

The JEOL 2100 LaB TEM is capable of high resolution imaging and is suitable for a wide range of materials, from nanomaterials to biological specimens. The choice of two operating voltages, 100kV and 200kV, allows scientists to image beam sensitive samples as well as more robust specimens. Single tilt, double tilt, and multi-specimen holders are available for use with this system. The multi-specimen holder supports 5 TEM grids allowing users to streamline their analysis and avoid lengthy sample exchange. The instrument also has an 80mm² XMAX EDX detector for elemental analysis.

Technical Specifications

  • Operating acceleration voltages 100 kV – 200 kV
  • Information limit 0.14 nm
  • Energy Dispersive X-ray (EDX) spectroscopy
  • Stage tilt of ± 60 degrees.
JEOL 2100 LaB TEM