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Ultramicroscopy

Ultramicroscopy Group starting in School of Physics in October

Hi, I’m Dr. Lewys Jones, my current research in metrology development is based around exploring the design and function of the aberration-corrected scanning transmission electron microscope (STEM), to improve the analysis of atomic-resolution annular dark-field (ADF) data and EELS and EDX chemical mapping. Themes include ADF normalisation by detector efficiency, correction of scan-noise and scan-distortion and correction of artefacts in EELS spectra. As part of this research, a series of image analysis and processing codes have been written to inspect, improve and quantify atomic-resolution ADF STEM data.



Principal Investigator

Dr. Lewys Jones
School of Physics
Trinity College Dublin
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