Prof. Hongzhou Zhang
Phone: +353 1 896 4655
Fax: +353 1 896 3037
Office: SNIAM, 1.06
I received MSc and PhD physics degrees from Peking University (China) and Rice University (US) in 1996 and 1999, respectively. My PhD supervisors are Drs Thomas A Rabson and Marc A. Robert. During 2002 to 2004 I held a post-doctoral position at the National Laboratory of Mesoscopic Physics and Electron Microscopy (Peking University, China).
My research involves extensive characterization of a variety of different nanostructures through collaboration with the other PIs in CRANN and external researchers. In 2004 I became a research fellow in the Electronic Materials Engineering Department in the Australian National University.
CRANN & Trinity College
For the last 5 years, a large part of my research has been concerned with the application of electron microscopy to the characterization of nanostructures with a focus of the growth-structure-property relationship of nanostructures. My colleagues and I have been able to develop new growth techniques for several nanostructures and to understand some aspects of their physical properties.
Scanning Helium Ion Microscopy
My current research is focused on the development and applications of scanning helium ion microscopy (HIM). To understand the unique contrast mechanisms provided by He ions, I am interested in the physics of ion-matter interaction and details of signal generation and detection.
For the helium ion microscope, is it possible to achieve atomic resolution, high-sensitive analysis and clean milling with Angstrom precision?
- Daniel Fox, Yanhui Chen, Colm C. Faulkner & Hongzhou Zhang.
- Beilstein Journal of Nanotechnology (2012)
- R Verre, K Fleischer, J F McGilp, D Fox, G Behan, H Zhang and I V Shvets
- Santos-Martinez MJ, Inkielewicz-Stepniak I, Medina C, Rahme K, D'Arcy DM, Fox D, Holmes JD, Zhang H, Radomski MW
- International Journal of Nanomedicine(2012)