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Colaborators

CHINA

• Prof Jun Wang, SIOM, CAS, Shanghai
• Prof. Yu Chen, ECUST, Shanghaii

EUROPE

• Prof. Jonathan Coleman, TCD
• Prof. Mathias Senge, TCD
• Prof. John M. Kelly, TCD
• Prof. Valeria Nicolosi, TCD
• Dr. Valerie Barron, APT

INDUSTRIAL

• Micro-Energy Experts Group
• Biometric Technology Solutions Ltd

UNITED STATES

• Prof. David Carroll, WFU, NC
• Prof. Seamus Curran, University of Houston, TX

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