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Lewys Jones
Ussher Assistant Professor, Physics

Publications and Further Research Outputs

Peer-Reviewed Publications

Pich{\'e, Targeted T 1 MRI contrast enhancement with extraordinarily small CoFe2O4 nanoparticles, ACS Applied Materials \& Interfaces, 2019 Journal Article, 2019

Aakash Varambhia, Lewys Jones, Andrew London, Dogan Ozkaya, Peter D. Nellist, Sergio Lozano-Perez, Determining EDS and EELS partial cross-sections from multiple calibration standards to accurately quantify bi-metallic nanoparticles using STEM, Micron, 113, 2018, p69 - 82 Journal Article, 2018

Nellist, PD and Martinez, GT and O†Leary, C and Jones, L, Exploring the Limits of Focused-Probe STEM Ptychography, Microscopy and Microanalysis, 24, (S1), 2018, p190--191 Journal Article, 2018

Jones, Lewys and Wang, Shuqiu and Hu, Xiao and ur Rahman, Shams and Castell, Martin R, Maximising the resolving power of the scanning tunneling microscope, Advanced structural and chemical imaging, 4, (1), 2018, p7 Journal Article, 2018

Rusz, Jan and Negi, Devendra and Jones, Lewys and Idrobo, Juan-Carlos, Towards Nanometer-Scale Three-Dimensional Magnetic Studies with Atomic Size Electron Vortex Beams, Microscopy and Microanalysis, 24, (S1), 2018, p918--919 Journal Article, 2018

Stevens, Andrew and Yang, Hao and Hao, Weituo and Jones, Lewys and Ophus, Colin and Nellist, Peter D and Browning, Nigel D, Subsampled STEM-ptychography, Applied Physics Letters, 113, (3), 2018, p033104-1 - 033104-5 Journal Article, 2018

Jones, L and Varambhia, A and Sawada, H and Nellist, PD, An optical configuration for fastidious STEM detector calibration and the effect of the objective-lens pre-field, Journal of microscopy, 2018 Journal Article, 2018

Ellaby, Tom Henry and Aarons, Jolyon and Varambhia, Aakash and Jones, Lewys and Nellist, Peter and {\"O, Ideal vs real: Simulated annealing of experimentally derived and geometric platinum nanoparticles, Journal of Physics: Condensed Matter, 2018 Journal Article, 2018

Varambhia, Aakash and Jones, Lewys and London, Andrew and Ozkaya, Dogan and Nellist, Peter D and Lozano-Perez, Sergio, Determining EDS and EELS partial cross-sections from multiple calibration standards to accurately quantify bi-metallic nanoparticles using STEM, Micron, 113, 2018, p69--82 Journal Article, 2018

Jones, Lewys and Downing, Clive, The MTF & DQE of Annular Dark Field STEM: Implications for Low-dose Imaging and Compressed Sensing, Microscopy and Microanalysis, 24, (S1), 2018, p478 - 479 Journal Article, 2018

Cherns, David and Griffiths, Ian J and Jones, Lewys and Bishop, Douglas M and Lloyd, Michael A and McCandless, Brian E, Direct Observation of High Densities of Antisite Defects in Ag2ZnSnSe4, ACS Applied Energy Materials, 1, (11), 2018, p6260--6267 Journal Article, 2018

Negi, Devendra and Jones, Lewys and Idrobo, Juan-Carlos and Rusz, J{\'a, Proposal for a three-dimensional magnetic measurement method with nanometer-scale depth resolution, Physical Review B, 98, (17), 2018, p174409 Journal Article, 2018

Jones, Lewys and Varambhia, Aakash and Beanland, Richard and Kepaptsoglou, Demie and Griffiths, Ian and Ishizuka, Akimitsu and Azough, Feridoon and Freer, Robert and Ishizuka, Kazuo and Cherns, David and others, Managing dose - damage-and data-rates in multi-frame spectrum-imaging, Microscopy, 2018 Journal Article, 2018

Sagawa, Ryusuke and Yang, Hao and Jones, Lewys and Simson, Martin and Huth, Martin and Soltau, Heike and Nellist, Peter D and Kondo, Yukihito, Development of Fast Pixelated STEM Detector and its Applications using 4-Dimensional Dataset, Microscopy and Microanalysis, 23, (S1), 2017, p52--53 Journal Article, 2017

Martinez, GT and Pennycook, TJ and Naginey, TC and Jones, L and Yang, H and Yates, JR and Nicholls, RJ and Huth, M and Simson, M and Soltau, H and others, Towards a Direct Visualization of Charge Transfer in Monolayer Hexagonal Boron Nitride using a Fast Pixelated Detector in the Scanning Transmission Electron Microscope, Microscopy and Microanalysis, 23, (S1), 2017, p436--437 Journal Article, 2017

Jones, Lewys and Wenner, Sigurd and Nord, Magnus and Ninive, Per Harald and L{\o, Optimising multi-frame ADF-STEM for high-precision atomic-resolution strain mapping, Ultramicroscopy, 179, 2017, p57--62 Journal Article, 2017

Jolyon Aarons, Lewys Jones, Aakash Varambhia, Katherine E. MacArthur, Dogan Ozkaya, Misbah Sarwar, Chris-Kriton Skylaris, Peter D. Nellist, Predicting the Oxygen-Binding Properties of Platinum Nanoparticle Ensembles by Combining High-Precision Electron Microscopy and Density Functional Theory, Nano Letters, 2017 Journal Article, 2017

Jones, Lewys and Skylaris, Chris-Kriton and Nellist, Peter D and Varambhia, Aakash and Aarons, Jolyon and MacArthur, Katherine E and Ozkaya, Dogan and Sarwar, Misbah, From High-precision Imaging to High-performance Computing: Leveraging ADF-STEM Atom-counting and DFT for Catalyst Nano-metrology, Microscopy and Microanalysis, 23, (S1), 2017, p1880--1881 Journal Article, 2017

Annelies De wael, Annick De Backer, Lewys Jones, Peter D. Nellist, Sandra Van Aert, Hybrid statistics-simulations based method for atom-counting from ADF STEM images, Ultramicroscopy, 177, 2017, p69--77 Journal Article, 2017

, Electron ptychographic phase imaging of light elements in crystalline materials using Wigner distribution deconvolution., Ultramicroscopy, 2017 Journal Article, 2017

Yang, Hao and dos Reis, Roberto and Martinez, Gerardo and Jones, Lewys and Simson, Martin and Soltau, Heike and Kondo, Yukihito and Sagawa, Ryusuke and Pennycook, Timothy and Nellist, Peter, Electron ptychographic phase imaging using fast pixelated detectors, Acta Cryst, 70, 2017, pC1349 Journal Article, 2017

Wang, Yi and Jones, Lewys and Berkels, Benjamin and Sigle, Wilfried and van Aken, Peter A, Measuring the Cation and Oxygen Atomic Column Displacement at Picometer Precision, Microscopy and Microanalysis, 23, (S1), 2017, p1612--1613 Journal Article, 2017

Varambhia, Aakash M and Jones, Lewys and De Backer, Annick and Van Aert, Sandra and Ozkaya, Dogan and Lozano-Perez, Sergio and Nellist, Peter D, Quantitative STEM of Catalyst Nanoparticles using ADF Imaging with Simultaneous EDS and EELS Spectroscopy., Microscopy and Microanalysis, 23, (S1), 2017, p1888--1889 Journal Article, 2017

A. De Backer, L. Jones, I. Lobato, T. Altantzis, B. Goris, P. D. Nellist, S. Bals, S. Van Aert, Three-dimensional atomic models from a single projection using Z-contrast imaging: verification by electron tomography and opportunities, Nanoscale, 2017 Journal Article, 2017

Nellist, Peter and Martinez, Gerardo and Pennycook, Timothy and Jones, Lewys and Yang, Hao and Huth, Martin and Simson, Martin and Soltau, Heike and Kondo, Yukihito and Sagawa, Ryusuke, Imaging charge transfer in crystals using electron ptychography, Foundations of Crystallography, 70, 2017, pC121 Journal Article, 2017

Walther, Thomas and Jones, Lewys, Preface to special issue on Microscopy of Semiconducting Materials 2017 (MSM-XX), Journal of microscopy, 268, (3), 2017, p221--224 Journal Article, 2017

Ian J. McPherson, Philip A. Ash, Lewys Jones, Aakash Varambhia, Robert M. J. Jacobs, Kylie A. Vincent, Electrochemical CO Oxidation at Platinum on Carbon Studied through Analysis of Anomalous in Situ IR Spectra, The Journal of Physical Chemistry C, 2017 Journal Article, 2017

Kleibeuker, Jos{\'e, Route to achieving perfect B-site ordering in double perovskite thin films, NPG Asia Materials, 9, (7), 2017, pe406 Journal Article, 2017

Wenner, Sigurd and Jones, Lewys and Marioara, Calin D and Holmestad, Randi, Atomic-resolution chemical mapping of ordered precipitates in Al alloys using energy-dispersive X-ray spectroscopy, Micron, 96, 2017, p103--111 Journal Article, 2017

Pennycook, Timothy J and Yang, Hao and Jones, Lewys and Cabero, Mariona and Rivera-Calzada, Alberto and Leon, Carlos and Varela, Maria and Santamaria, Jacobo and Nellist, Peter D, 3D elemental mapping with nanometer scale depth resolution via electron optical sectioning, Ultramicroscopy, 174, 2017, p27--34 Journal Article, 2017

, Atomic-resolution chemical mapping of ordered precipitates in Al alloys using energy-dispersive X-ray spectroscopy., Micron (Oxford, England : 1993), 2017 Journal Article, 2017

, 3D elemental mapping with nanometer scale depth resolution via electron optical sectioning., Ultramicroscopy, 2017 Journal Article, 2017

Hao Yang, Roberto dos Reis, Colin Ophus, Peter Ercius, Gerardo T. Martinez, Lewys Jones, Martin Huth, Martin Simson, Heike Soltau, Yukihito Kondo, Ryusuke Sagawa, Timothy J. Pennycook, Peter D. Nellist, Simultaneous imaging of light and heavy elements at atomic resolution using electron ptychography and fast pixelated detectors, Acta Crystallographica Section A Foundations and Advances, 73, (a1), 2017, pa168--a168 Journal Article, 2017

Yang, Hao and MacLaren, Ian and Jones, Lewys and Martinez, Gerardo T and Simson, Martin and Huth, Martin and Ryll, Henning and Soltau, Heike and Sagawa, Ryusuke and Kondo, Yukihito and others, Electron ptychographic phase imaging of light elements in crystalline materials using Wigner distribution deconvolution, Ultramicroscopy, 180, 2017, p173--179 Journal Article, 2017

, Optimising multi-frame ADF-STEM for high-precision atomic-resolution strain mapping., Ultramicroscopy, 2017 Journal Article, 2017

Jones, Lewys and Wenner, Sigurd and Nord, Magnus Kristofer and Ninive, Per Harald and L{\o, Mapping the chemistry within, and the strain around, Al-alloy precipitates at atomic resolution by multi-frame scanning transmission electron microscopy, 2017 Journal Article, 2017

Nellist, PD and Yang, H and Jones, L and Martinez, GT and Rutte, RN and Davis, BD and Pennycook, TJ and Simson, M and Huth, M and Soltau, H and others, The Use of Electron Ptychography to Implement Efficient Phase Imaging in STEM, Microscopy and Microanalysis, 22, 2016, p466 Journal Article, 2016

Gonnissen, J., Batuk, D., Nataf, G.F., Jones, L., Abakumov, A.M., Van Aert, S., Schryvers, D., Salje, E.K.H., Direct Observation of Ferroelectric Domain Walls in LiNbO3: Wall-Meanders, Kinks, and Local Electric Charges, Advanced Functional Materials, 26, (42), 2016, p7599-7604 Journal Article, 2016

Salih, J.M., Wang, L.Q., Ramasse, Q.M., Jones, L., Barthel, J., Craven, A.J., Maclaren, I., Maghemite-like regions at the crossing of two antiphase boundaries in doped BiFeO3, Materials Science and Technology (United Kingdom), 32, (3), 2016, p242-247 Journal Article, 2016

Jones, L., Quantitative ADF STEM: Acquisition, analysis and interpretation, IOP Conference Series: Materials Science and Engineering, 109, (1), 2016 Journal Article, 2016

Jones, Lewys and Varambhia, Aakash and Kepaptsoglou, Demie and Ramasse, Quentin and Freer, Robert and Azough, Feridoon and Lozano-Perez, Sergio and Beanland, Richard and Nellist, Peter, New Opportunities in multi-frame STEM Spectroscopy \& Fractional Beam-current EELS, European Microscopy Congress, 2016 Conference Paper, 2016

Varambhia, Aakash and Jones, Lewys and De Backer, Annick and Fauske, Vidar and Van Aert, Sandra and Ozkaya, Dogan and Lozano-Perez, Sergio and Nellist, Peter, Experiment design for quantitative dark field imaging and spectroscopy of catalyst nanoparticles using Scanning Transmission Electron Microscopy (STEM), European Microscopy Congress, 2016 Conference Paper, 2016

Van Aert, Sandra and De Backer, Annick and Jones, Lewys and Martinez, Gerardo T and Goris, Bart and Altantzis, Thomas and B{\'e, Non-destructive nanoparticle characterisation using a minimum electron dose in quantitative ADF STEM: how low can one go?, European Microscopy Congress, 2016 Conference Paper, 2016

Spurgeon, Steven and Kepaptsoglou, Despoina and Jones, Lewys and Comes, Ryan and Ramasse, Quentin and Ong, Phuong-Vu and Sushko, Peter and Chambers, Scott, Monochromated STEM-EELS Analysis of Interface-Induced Polarization in LaCrO3-SrTiO3 Superlattices, European Microscopy Congress, 2016 Conference Paper, 2016

Nellist, Peter and Yang, Hao and Jones, Lewys and Martinez, Gerardo and Rutte, Reida and Davis, Benjamin and Pennycook, Timothy and Simson, Martin and Huth, Martin and Soltau, Heike and others, Efficient and quantitative phase imaging in two-and three-dimensions using electron ptychography in STEM, European Microscopy Congress 2016, 2016 Conference Paper, 2016

Jones, Lewys and Varambhia, Aakash and Wenner, Sigurd and Nord, Magnus and Ninive, Per Harald and L{\o, Nano-scale strain measurements from high-precision ADF STEM, European Microscopy Congress 2016, 2016 Conference Paper, 2016

Simson, Martin and Dunin-Borkowski, Rafal E and Hartmann, Robert and Huth, Martin and Ihle, Sebastian and Jones, Lewys and Kondo, Yukihito and Migunov, Vadim and Nellist, Peter D and Ritz, Robert and others, Extending the Limits of Fast Acquisition in TEM Tomography and 4D-STEM, European Microscopy Congress, 2016 Conference Paper, 2016

Hernandez-Maldonado, David and Yang, Hao and Jones, Lewys and Gr{\"o, STEM optical sectioning for imaging screw dislocation core structures, European Microscopy Congress 2016, 2016 Conference Paper, 2016

Gonnissen, Julie and Batuk, Dmitry and Nataf, Guillaume F and Jones, Lewys and Abakumov, Artem M and Van Aert, Sandra and Schryvers, Dominique and Salje, Ekhard KH, Direct observation of ferroelectric domain walls in, 2016 Journal Article, 2016

Vogt, T., Blom, D.A., Jones, L., Buttrey, D.J., ADF-STEM Imaging of Nascent Phases and Extended Disorder Within the Mo"V"Nb"Te"O Catalyst System, Topics in Catalysis, 59, (17-18), 2016, p1489-1495 Journal Article, 2016

Hernandez-Maldonado, David and Yang, Hao and Jones, Lewys and Gr{\"o, STEM Optical Sectioning for Imaging Screw Dislocations Core Structures in BCC Metals, Microscopy and Microanalysis, 22, 2016, p1932 Journal Article, 2016

Simson, M and Dunin-Borkowski, RE and Hartmann, R and Huth, M and Ihle, S and Jones, L and Kondo, Y and Migunov, V and Nellist, PD and Ritz, R and others, Pushing the Limits of Fast Acquisition in TEM Tomography and 4D-STEM, Microscopy and Microanalysis, 22, (S3), 2016, p512--513 Journal Article, 2016

Yang, H and Jones, L and Rutte, RN and Davis, BD and Pennycook, TJ and Simson, M and Huth, M and Soltau, H and Str{\"u, Phase Imaging in STEM Allowing for Post-Acquisition Aberration Correction and 3D Optical Sectioning using Ptychography Wigner-Distribution Deconvolution, Microscopy and Microanalysis, 22, 2016, p508 Journal Article, 2016

Pich{\'e, Atomic resolution electron microscopy of cobalt ferrite nanoparticles, European Microscopy Congress, 2016 Conference Paper, 2016

Comes, Ryan B and Spurgeon, Steven R and Heald, Steve M and Kepaptsoglou, Despoina M and Jones, Lewys and Ong, Phuong Vu and Bowden, Mark E and Ramasse, Quentin M and Sushko, Peter V and Chambers, Scott A, Interface-Induced Polarization in SrTiO3-LaCrO3 Superlattices, Advanced Materials Interfaces, 3, (10), 2016 Journal Article, 2016

Nellist, PD and Jones, L and Varambhia, A and De Backer, A and Van Aert, S and Ozkaya, D, Quantification of ADF STEM Image Data for Nanoparticle Structure and Strain Measurements, Microscopy and Microanalysis, 22, 2016, p896 Journal Article, 2016

Varambhia, A.M., Jones, L., De Backer, A., Fauske, V.T., Van Aert, S., Ozkaya, D., Nellist, P.D., Quantifying a Heterogeneous Ru Catalyst on Carbon Black Using ADF STEM, Particle and Particle Systems Characterization, 33, (7), 2016, p438-444 Journal Article, 2016

Comes, R.B., Spurgeon, S.R., Heald, S.M., Kepaptsoglou, D.M., Jones, L., Ong, P.V., Bowden, M.E., Ramasse, Q.M., Sushko, P.V., Chambers, S.A., Interface-Induced Polarization in SrTiO3-LaCrO3 Superlattices, Advanced Materials Interfaces, 3, (10), 2016 Journal Article, 2016

Sagawa, Ryusuke and Yang, Hao and Jones, Lewys and Simson, Martin and Huth, Martin and Soltau, Heike and Nellist, Peter and Kondo, Yukihito, Ptychographic phase reconstruction and aberration correction of STEM image using 4D dataset recorded by pixelated detector, European Microscopy Congress, 2016 Conference Paper, 2016

Spurgeon, Steven R and Kepaptsoglou, Despoina M and Jones, Lewys and Comes, Ryan B and Ramasse, Quentin M and Ong, Phuong-Vu and Sushko, Peter V and Chambers, Scott A, Correlative Aberration-Corrected STEM-HAADF and STEM-EELS Analysis of Interface-Induced Polarization in LaCrO 3-SrTiO 3 Superlattices, Microscopy and Microanalysis, 22, 2016, p1522 Journal Article, 2016

Martinez, Gerardo T and Yang, Hao and Jones, Lewys and Simson, Martin and Huth, Martin and Soltau, Heike and Str{\"u, Study on the robustness of electron ptychography for phase imaging in the STEM using fast pixelated detectors, European Microscopy Congress, 2016 Conference Paper, 2016

Yang, H., Rutte, R.N., Jones, L., Simson, M., Sagawa, R., Ryll, H., Huth, M., Pennycook, T.J., Green, M.L.H., Soltau, H., Kondo, Y., Davis, B.G., Nellist, P.D., Simultaneous atomic-resolution electron ptychography and Z-contrast imaging of light and heavy elements in complex nanostructures, Nature Communications, 7, 2016 Journal Article, 2016

De Backer, A., De wael, A., Gonnissen, J., Martinez, G.T., Béché, A., MacArthur, K.E., Jones, L., Nellist, P.D., Van Aert, S., Quantitative annular dark field scanning transmission electron microscopy for nanoparticle atom-counting: What are the limits?, Journal of Physics: Conference Series, 644, (1), 2015 Journal Article, 2015

Yang, Hao and Lozano, Juan G and Pennycook, Timothy J and Jones, Lewys and Hirsch, Peter B and Nellist, Peter D, STEM Optical Sectioning for Imaging Screw Displacements in Dislocation Core Structures, Microscopy and Microanalysis, 21, 2015, p1927 Journal Article, 2015

Lewys Jones, Katherine E. MacArthur, Jolyon Aarons, Chris-Kriton Skylaris, Misbah Sarwar, Dogan Ozkaya, Peter D. Nellist, Towards Statistically Representative Atomic Resolution 3D Nano-metrology for Materials Modelling and Catalyst Design, Microsc Microanal, 21, (S3), 2015, p2197--2198 Journal Article, 2015

Spurgeon, S.R., Balachandran, P.V., Kepaptsoglou, D.M., Damodaran, A.R., Karthik, J., Nejati, S., Jones, L., Ambaye, H., Lauter, V., Ramasse, Q.M., Lau, K.K.S., Martin, L.W., Rondinelli, J.M., Taheri, M.L., Polarization screening-induced magnetic phase gradients at complex oxide interfaces, Nature Communications, 6, 2015 Journal Article, 2015

De Backer, A., Martinez, G.T., MacArthur, K.E., Jones, L., Béché, A., Nellist, P.D., Van Aert, S., Dose limited reliability of quantitative annular dark field scanning transmission electron microscopy for nano-particle atom-counting, Ultramicroscopy, 151, 2015, p56-61 Journal Article, 2015

Lewys Jones, Hao Yang, Katherine E. MacArthur, Henning Ryll, Martin Simson, Heike Soltau, Yukihito Kondo, Ryusuke Sagawa, Hiroyuki Banba, Peter D. Nellist, Opportunities in Angularly Resolved Dark-field STEM using Pixelated Detectors, Microsc Microanal, 21, (S3), 2015, p2411--2412 Journal Article, 2015

Advanced Structural & Chemical Imaging, Springer Open, [eds.], 2015 Editorial Board, 2015 URL

Yang, H., Jones, L., Ryll, H., Simson, M., Soltau, H., Kondo, Y., Sagawa, R., Banba, H., MacLaren, I., Nellist, P.D., 4D STEM: High efficiency phase contrast imaging using a fast pixelated detector, Journal of Physics: Conference Series, 644, (1), 2015 Journal Article, 2015

Simson, M and Ryll, H and Banba, H and Hartmann, R and Huth, M and Ihle, S and Jones, L and Kondo, Y and Muller, K and Nellist, PD and others, 4D-STEM imaging with the pnCCD (S) TEM-camera, Microscopy and Microanalysis, 21, 2015, p2211 Journal Article, 2015

Varambhia, A.M., Jones, L., Nellist, P.D., Lozano-Perez, S., Ozkaya, D., Quantification of a heterogeneous ruthenium catalyst on carbon-black using ADF imaging, Journal of Physics: Conference Series, 644, (1), 2015 Journal Article, 2015

Yang, H and Lozano, JG and Pennycook, TJ and Jones, L and Hirsch, PB and Nellist, PD, Imaging screw dislocations at atomic resolution by aberration-corrected electron optical sectioning, Nature communications, 6, 2015 Journal Article, 2015

Jones, Lewys and Beanland, Richard and Lozano-Perez, Sergio and Baba-kishi, Karim and Nellist, Peter D, Improving the SNR of Atomic Resolution STEM EELS \& EDX Mapping while Reducing Beam-damage by using Non-rigid Spectrum-image Averaging, Microscopy and Microanalysis, 21, 2015, p1215 Journal Article, 2015

Martinez, G.T., Jones, L., De Backer, A., Béché, A., Verbeeck, J., Van Aert, S., Nellist, P.D., Quantitative STEM normalisation: The importance of the electron flux, Ultramicroscopy, 159, (P1), 2015, p46-58 Journal Article, 2015

Pennycook, T.J., Lupini, A.R., Yang, H., Murfitt, M.F., Jones, L., Nellist, P.D., Efficient phase contrast imaging in STEM using a pixelated detector. Part 1: Experimental demonstration at atomic resolution, Ultramicroscopy, 151, 2015, p160-167 Journal Article, 2015

Ian MacLaren, Hao Yang, Lewys Jones, Peter D. Nellist, Henning Ryll, Martin Simson, Heike Soltau, Yukihito Kondo, Ryusuke Sagawa, Hiroyuki Banba, Atomic resolution ptychographic phase contrast imaging of polar-ordered structures in functional oxides, Microsc Microanal, 21, (S3), 2015, p1221--1222 Journal Article, 2015

Jones, Lewys and Yang, Hao and Pennycook, Timothy J and Marshall, Matthew SJ and Van Aert, Sandra and Browning, Nigel D and Castell, Martin R and Nellist, Peter D, Smart Alignâ€"a new tool for robust non-rigid registration of scanning microscope data, Advanced Structural and Chemical Imaging, 1, (1), 2015, p1--16 Journal Article, 2015

Yang, Hao and Jones, Lewys and Ryll, Henning and Simson, Martin and Soltau, Heike and Kondo, Yukihito and Sagawa, Ryusuke and Banba, Hiroyuki and Pennycook, Timothy J and Nellist, Peter D, High efficiency phase contrast imaging in STEM using fast direct electron pixelated detectors, Microscopy and Microanalysis, 21, 2015, p2303 Journal Article, 2015

Lewys Jones, Gerardo T. Martinez, Armand Béché, Sandra Van Aert, Peter D. Nellist, Getting the Best from an Imperfect Detector - an Alternative Normalisation Procedure for Quantitative HAADF STEM, Microscopy and Microanalysis, 20, (S3), 2014, p126--127 Journal Article, 2014

Timothy J. Pennycook, Lewys Jones, Mariona Cabero, Alberto Ribera-Calzada, Carlos Leon, Maria Varela, Jacobo Santamaria, Peter D. Nellist, Optical Sectioning with Atomic Resolution Spectroscopy, Microscopy and Microanalysis, 20, (S3), 2014, p584--585 Journal Article, 2014

Pennycook TJ, Jones L, Pettersson H, Coelho J, Canavan M, Mendoza-Sanchez B, Nicolosi V, Nellist PD, Atomic scale dynamics of a solid state chemical reaction directly determined by annular dark-field electron microscopy., Scientific reports, 4, 2014, p7555 Journal Article, 2014 TARA - Full Text DOI

Prabakaran, A., Dillon, F., Melbourne, J., Jones, L., Nicholls, R.J., Holdway, P., Britton, J., Koos, A.A., Crossley, A., Nellist, P.D., Grobert, N., WS2 2D nanosheets in 3D nanoflowers, Chemical Communications, 50, (82), 2014, p12360-12362 Journal Article, 2014

Lewys Jones, Vidar T. Fauske, Katherine E. MacArthur, Antonius T. J. van Helvoort, Peter D. Nellist, Visualising the Three-dimensional Morphology and Surface Structure of Metallic Nanoparticles at Atomic Resolution by Automated HAADF STEM Atom Counting, Microscopy and Microanalysis, 20, (S3), 2014, p60--61 Journal Article, 2014

Lewys Jones, Peter D. Nellist, Testing the accuracy of the two-dimensional object model in HAADF STEM, Micron, 63, 2014, p47--51 Journal Article, 2014

Prabakaran, Arunvinay and Dillon, Frank and Melbourne, Jodie and Jones, Lewys and Nicholls, Rebecca J and Holdway, Phil and Britton, Jude and Koos, Antal A and Crossley, Alison and Nellist, Peter D and others, WS2 2D nanosheets in 3D nanoflowers, Chemical Communications, 50, (82), 2014, p12360--12362 Journal Article, 2014

Timothy J. Pennycook, Andrew R. Lupini, Lewys Jones, Peter D. Nellist, Maximum Efficiency STEM Phase Contrast Imaging, Microscopy and Microanalysis, 20, (S3), 2014, p382--383 Journal Article, 2014

Macarthur, K.E., Jones, L.B., Nellist, P.D., How flat is your detector? Non-uniform annular detector sensitivity in STEM quantification, Journal of Physics: Conference Series, 522, (1), 2014 Journal Article, 2014

Jones, L., Nellist, P.D., Two-dimensional object functions and three-dimensional illumination functions: Their validity, interaction and utility, Journal of Physics: Conference Series, 522, (1), 2014 Journal Article, 2014

Lewys Jones, Scan-noise and Drift Correction in the STEM, Micros. Today, 22, (03), 2014, p40--41 Journal Article, 2014

Jones, L., Macarthur, K.E., Fauske, V.T., Van Helvoort, A.T.J., Nellist, P.D., Rapid estimation of catalyst nanoparticle morphology and atomic-coordination by high-resolution Z-contrast electron microscopy, Nano Letters, 14, (11), 2014, p6336-6341 Journal Article, 2014

MacArthur, Katherine E and Jones, Lewys B and Lozano-Perez, S and Ozkaya, D and Nellist, PD, Quantification of Pt/Ir Catalyst Nanoparticles using ADF STEM, 18th International Microscopy Congress, Prague, Czech Republic, 2014 Conference Paper, 2014

Timothy J. Pennycook, Lewys Jones, Henrik Pettersson, Valeria Nicolosi, Peter D. Nellist, Probing Atomic Scale Dynamics with STEM, Microscopy and Microanalysis, 20, (S3), 2014, p104--105 Journal Article, 2014

Macarthur, K.E., Jones, L.B., Lozano-Perez, S., Ozkaya, D., Nellist, P.D., Structural quantification of nanoparticles by HAADF STEM, Journal of Physics: Conference Series, 522, (1), 2014 Journal Article, 2014

Jones, Lewys and Martinez, Gerardo T and B{\'e, Getting the Best from an Imperfect Detector, 2014 Journal Article, 2014

Jones, L., Nellist, P.D., Three-dimensional optical transfer functions in the aberration-corrected scanning transmission electron microscope, Journal of Microscopy, 254, (2), 2014, p47-64 Journal Article, 2014

Jones, Lewys, Applications of focal-series data in scanning-transmission electron microscopy, 2013 Thesis, 2013

Pennycook, Timothy J and Jones, Lewys and Nellist, Peter D, Position-Sensitive STEM Detectors for Ð igh-Sensitivity Phase Detection, Microsc. Microanal, 19, (2), 2013, p1181 Journal Article, 2013

Pennycook, Timothy J and Jones, Lewys and Cabero, Mariona and Ribera-Calzada, Alberto and Leon, Carlos and Varela, Maria and Santamaria, Jacobo and Nellist, Peter D, Depth Sensitive Atomic Resolution Spectroscopy and Imaging of Highly Strained YSZ/STO Epitaxial Heterostructures, Microscopy and Microanalysis, 19, (S2), 2013, p538--539 Journal Article, 2013

, Identifying and Correcting Scan Noise and Drift in the Scanning Transmission Electron Microscope, 2013 Journal Article, 2013

Pennycook, Timothy J and Jones, Lewys and Pettersson, Henrik and Nicolosi, Valeria and Nellist, Peter D, Atomic Scale Dynamics of a Manganese Oxide Phase Change Observed with STEM, Microscopy and Microanalysis, 19, (S2), 2013, p1876--1877 Journal Article, 2013

Jones, Lewys and Nellist, Peter D, Advances in 2D, 3D and 4D STEM Image Data Analysis, Microscopy and Microanalysis, 19, (S2), 2013, p770--771 Journal Article, 2013

Jones, L., Nellist, P.D., Post-processing of STEM Data for Instability and Drift Compensation, Microscopy and Microanalysis, 18, (S2), 2012, p1232-1233 Journal Article, 2012

, Three-Dimensional Crystal Structure Mapping by Diffractive Scanning Confocal Electron Microscopy (SCEM), 2012 Journal Article, 2012

Electronic Editing in, editor(s)Ken Price and Ray Siemens , Literary Studies in the Digital Age, New York, Modern Language Association, 2012, pp12 , [Susan Schreibman] Book Chapter, 2012 URL TARA - Full Text

, STEM Image Post-processing for Instability and Aberration Correction for Transfer Function Extension, 2012 Journal Article, 2012

Jones, L and Nellist, PD, A three-dimensional investigation of the STEM-probe/sample interaction by annular dark-field focal series, 15th European Microscopy Congress, 16th-21st September 2012, 2, 2012, pp459--460 Conference Paper, 2012

Jones, L., Nellist, P.D., Focal Series Reconstruction in Annular Dark-Field STEM, Microscopy and Microanalysis, 18, 2012, p1214-1215 Journal Article, 2012

Jones, Lewys and Nellist, Peter D, Focal Series Reconstruction in Annular Dark-Field STEM, Microscopy and Microanalysis, 18, (Supplement 2), 2012, p1214--1215 Journal Article, 2012

Jones, Lewys and Nellist, Peter D, Post-processing of STEM Data for Instability and Drift Compensation, 15th European Microscopy Congress, 16th-21st September 2012, 2, 2012, pp469--470 Conference Paper, 2012

Fuller, R., Target Risk, Review of Target Risk, by Wilde, G.J.S. , Safety Science , 1996 Review, 1996

Van Aert, Sandra and De Backer, Annick and Jones, Lewys and Martinez, Gerardo T and B{\'e, Control of knock-on damage for 3D atomic scale quantification of nanostructures: Making every electron count in scanning transmission electron microscopy Journal Article,

Lewys Jones and Chris-Kriton Skylaris and Peter D. Nellist and Aakash Varambhia and Jolyon Aarons and Katherine E. MacArthur and Dogan Ozkaya and Misbah Sarwar, From High-precision Imaging to High-performance Computing: Leveraging {ADF, Microscopy and Microanalysis, 23, (S1), p1880--1881 Journal Article, DOI

David Hernandez-Maldonado and Hao Yang and Lewys Jones and Roman Grà ¶ger and Peter B Hirsch and Quentin M. Ramasse and Peter D Nellist, STEM, Microscopy and Microanalysis, 22, (S3), p1932--1933 Journal Article, DOI

Steven R. Spurgeon and Despoina M. Kepaptsoglou and Lewys Jones and Ryan B. Comes and Quentin M. Ramasse and Phuong-Vu Ong and Peter V. Sushko and Scott A. Chambers, Correlative Aberration-Corrected {STEM, Microscopy and Microanalysis, 22, (S3), p1522--1523 Journal Article, DOI

Non-Peer-Reviewed Publications

A. R. Lupini, O. L. Krivanek, N. Dellby, P. D. Nellist and S. J. Pennycook, Developments in Cs-corrected STEM, Proc. EMAG2001, 2001, pp31 - 34 Conference Paper, 2001

Research Expertise

Keywords

Aberration Corrected Microscopy; ANGSTROM RESOLUTION; Annular Dark Field STEM; ATOMIC-RESOLUTION; ELECTRON MICROSCOPY; Fuel Cells; IMAGE PROCESSING; MOLECULAR DYNAMICS; TRANSMISSION ELECTRON MICROSCOPY

Recognition

Memberships

Fellow of the Royal Microscopical Society 2015