The module aims at providing foundation of electron microscopy and focused ion microscopy filling gaps in undergraduate education and allowing Research PhD students to take on research projects requiring advanced characterization of the microstructure and composition of materials down to the atomic limit.
On successful completion of this module, students will be able to:
- Understand the physics of image formation and microanalysis in electron microscopy.
- Understand various microscopy techniques of conventional and analytical electron microscopy like selected area diffraction, convergent beam diffraction, bright and dark field imaging, high resolution imaging, Z-contrast, etc. and know their capabilities and limits.
- Know how to apply these methods in materials research.
- David Williams and Barry Carter, Transmission Electron Microscopy, 2nd Edition, Springer
- Ludwig Reimer, Transmission Electron Microscopy, 5th Edition, Springer
- L. M. Peng, S. L. Dudarev, M. J. Whelan, High-energy Election Diffraction and Microscopy, Oxford Science Publications
- Brent Fultz, James M. Howe, Transmission Electron Microscopy and Diffraction of Materials, Springer
- J. W. Edington, Practical Electron Microscopy in Materials Science, The MacMillan Press, LTD
- Marc De Graef, Introduction to Conventional Transmission Electron Microscopy, Cambridge
- Eugene Hecht, Optics, Addison Wesley
- 1 - Introduction
- 2 - The Instrument
- 3 - Scattering and Kinematic Theory of ED
- 4 - Indexing SADPs
- 5 - Dynamical Theory
- 6 - Scattering Contrast
- 7 - Phase Contrast
- 8 - EDX and EELS
- 9 - SEM-HIM