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You are here Research > Research Groups > Photonics and Nanofabrication > HIM Workshop 2015 > Programme

Gas Ion Microscopy Workshop 2015

Monday, 13th July
Trinity College Dublin, Ireland

We will begin the morning of Monday the 13th of July at 9.30am with light refreshments while introductions are made. The talks will begin at 10am.

We will also have a social event on the Monday evening which will be sponsored by the CRANN and AMBER centres here at Trinity College Dublin.

For our attendees who have travelled from far and wide to come to Dublin we would be happy to join you on a tour of the city on Tuesday the 14th. Suggested destinations include the Book of Kells and the Guinness Storehouse.

The current agenda for the day:

Below is the list of currently confirmed attendees

Anto Yasaka
Photomask Repair Technology by using Gas Field Ion Source
A. Yasaka, F. Aramaki, T. Kozakai, O. Matsuda, K. Shiina, H. Oba, Y. Sugiyama, K. Aita, and M. Muramatsu
Hitachi High-Tech Science Corporation

Paul Alkemade
Exposure of BN-encapsulated graphene to helium ions
Paul Alkemade and Gaurav Nanda
TNW, TU Delft

Hiroshi Mizuta
Electrical properties of graphene devices modified by helium ion irradiation
Shuojin Hang 1, Zakaria Moktadir 1, Jamie Raynolds 1, Hiroshi Mizuta 1,2
1. Nano Research Group, University of Southampton, UK
2. Japan Advanced Institute of Science and Technology, Ishikawa, Japan

Shinichi Ogawa
Helium Ion Microscopy (HIM) Technology for Imaging, Characterization, and nano-Fabrication for nano-Device Materials and Structures
Shinichi Ogawa
Nanoelectronics Research Institute, National Institute of Advanced Industrial Science and Technology (AIST), Japan

Stuart Boden
Nanoscale pattern definition with Helium ion beam lithography
Xiaoqing Shi 1, Philip Prewett 2, Ejaz Huq 2, Darren M Bagnall 3, Stuart A Boden 1,
1 Nanoelectronics & Nanotechnology Group, Electronics and Computer Science, Faculty of Physical Sciences and Engineering, University of Southampton, Southampton, SO16 1BJ, UK
2 Oxford Scientific Consultants Ltd., Dorchester-on-Thames, Oxfordshire, OX10 7HN, UK
3 Faculty of Engineering, The University of New South Wales 3, Sydney, NSW 2052, Australia

Marek Schmidt
Fabrication and imaging of graphene-based nanostructures by helium and nitrogen ion beam
Marek E. Schmidt 1, Ohta Takechi 1, Manoharan Muruganathan 1, Hiroshi Mizuta 1,2
1 Japan Advanced Institute of Science and Technology, Ishikawa, Japan
2 Nano Research Group, University of Southampton, UK

Daniel Fox
Helium Ion Microscopy at CRANN
Daniel Fox, Yangbo Zhou, Pierce Maguire, Hongzhou Zhang
CRANN and School of Physics, Trinity College Dublin, Dublin 2, Ireland

Filip Mika
Characterization Technique of Materials by Scanning Low Energy Electron Microscope.
Filip Mika, Ilona Müllerová, Zuzana Pokorná, Ivo Konvalina, Eliška Mikmeková, Aleš Paták and Luděk Frank
Laboratories for Electron Microscopy and Image Analysis, Institute for Scientific Instruments, Brno, CZ

David Dowsett
Sub 20nm elemental mapping on the helium ion microscope
Advanced Instrumentation for Ion Nano-Analytics (AINA), Luxembourg Institute of Science and Technology (LIST), Luxembourg

Cornelia Rodenburg
Chemical and thickness mapping of complex polymer structures in the Helium Ion Microscope
Robert Masters, Yangbo Zhou, Hongzhou Zhang, Xiong Liu, Cornelia Rodenburg
Department of Materials Science and Engineering, The University of Sheffield, UK

Yoshi Tsuchiya
Quantum Technology Centre, University of Southampton, Southampton, UK

Yangbo Zhou
CRANN and School of Physics, Trinity College Dublin, Dublin 2, Ireland

Hongzhou Zhang
CRANN and School of Physics, Trinity College Dublin, Dublin 2, Ireland

Hiroshi Mizuta
Japan Advanced Institute of Science and Technology, Ishikawa, Japan
Electronics and Computer Science, Faculty of Physical Sciences and Engineering, University of Southampton, Southampton, UK

Pierce Maguire
CRANN and School of Physics, Trinity College Dublin, Dublin 2, Ireland

Gregor Hlawacek
Ion Beam Physics and Materials Research, Helmholtz-Zentrum Dresden-Rossendorf, Dresden, Germany

Alan Bell
Intel Corporation, Researcher in Residence at CRANN, Trinity College Dublin, Dublin 2, Ireland