Trinity College Dublin

Skip to main content.

Top Level TCD Links

Sitemap

Postgraduate Lectures - Course PY5003: Surface Science

Lecturer: I.T. McGovern

  • Why Surface Science; Surface Science and vacuum; fundamentals of vacuum; kinetic theory and gas flow; conductance, pumping speed and throughput; rate of evacuation
  • Pressure measurement: Pirani and thermocouple gauges; Bayard-Alpert ionisation gauge; Penning ionisation gauge; residual gas analysis; important gases
  • Pumps: rotary pump; oil diffusion pump; turbo(molecula)r pump; sorption and cryo pumps; sublimation pumps; ion(isation) pumps
  • Chamber design: pumping speed, leaks and outgassing; chamber materials; outgassing rates; welding and surface finish; conflat flanges; swagelok fittings; KF flanges; bakeout facilities
  • Vacuum fittings: bellows concept; valves; linear motion drives; rotary drives; viewport; power, therocouple and cooling feedthroughs
  • Surface structure I: Miller indices; unit meshes; reconstruction; Wood's notation; surface domains; reciprocal lattices
  • Surface structure II: low energy electron diffraction (LEED); LEED apparatus; I-V curves; spot profiles; reflection high enenergy electron diffraction (RHEED); photoelectron diffraction
  • Surface Characterisation I: surface sensitivity of electrons; photoelectron fundamentals; x-ray photoelectron spectroscopy (XPS); spectral contributions; quantiative analysis; chemical shift; electron spectroscopy for chemical analysis (ESCA)
  • Surface Characterisation II: Auger electron spectroscopy (AES); derivative spectrum; scanning Auger microscopy (SAM); ion-etch depth profiling; secondary ion mass spectrometry (SIMS); dynamic SIMS; raster-lens-gate technique; ion surface scattering (ISS)
  • Ion/electron analysers: retarding Field (LEED) analyser; cylindrical mirror analyser (CMA); concentric hemispherical analyser (CHA); magnetic deflection analyser (MDA); time of flight analyser (TOF); quadrupole mass spectrometer (QMA); ion/electron detectors
  • Scanning probe microscopy: scanning tunneling microscope (STM); basic principles; constant height and current modes; simple models; beyond Bardeen model; atomic force microscopy; other probes
  • Surface preparation: degreasing and pre-etch; abrasion, fracture, cleaving; thermal desorption; ion etching; chemical reaction; gas exposure; evaporation; magnetron sputtering; knudsen cells; quartz crystal monitor

Last updated 18 April 2012 physics@tcd.ie (Email).