Postgraduate Lectures - Course PY5003

SURFACE SCIENCE AND TECHNOLOGY

Lecturer: Cormac McGuinness

• Why Surface Science; Surface Science and vacuum; fundamentals of vacuum; kinetic theory and gas flow; conductance, pumping speed and throughput; rate of evacuation
• Pressure measurement: Pirani and thermocouple gauges; Bayard-Alpert ionisation gauge; Penning ionisation gauge; residual gas analysis; important gases
  Pumps: rotary pump; oil diffusion pump; turbo(molecula)r pump; sorption and cryo pumps; sublimation pumps; ion(isation) pumps
• Chamber design: pumping speed, leaks and outgassing; chamber materials; outgassing rates; welding and surface finish; conflat flanges; swagelok fittings; KF flanges; bakeout facilities
• Vacuum fittings: bellows concept; valves; linear motion drives; rotary drives; viewport; power, therocouple and cooling feedthroughs
• Surface structure I: Miller indices; unit meshes; reconstruction; Wood's notation; surface domains; reciprocal lattices
• Surface structure II: low energy electron diffraction (LEED); LEED apparatus; I-V curves; spot profiles; reflection high enenergy electron diffraction (RHEED); photoelectron diffraction
• Surface Characterisation I: surface sensitivity of electrons; photoelectron fundamentals; x-ray photoelectron spectroscopy (XPS); spectral contributions; quantiative analysis; chemical shift; electron spectroscopy for chemical analysis (ESCA)
• Surface Characterisation II: Auger electron spectroscopy (AES); derivative spectrum; scanning Auger microscopy (SAM); ion-etch depth profiling; secondary ion mass spectrometry (SIMS); dynamic SIMS; raster-lens-gate technique; ion surface scattering (ISS)
• Ion/electron analysers: retarding Field (LEED) analyser; cylindrical mirror analyser (CMA); concentric hemispherical analyser (CHA); magnetic deflection analyser (MDA); time of flight analyser (TOF); quadrupole mass spectrometer (QMA); ion/electron detectors
• Scanning probe microscopy: scanning tunneling microscope (STM); basic principles; constant height and current modes; simple models; beyond Bardeen model; atomic force microscopy; other probes
• Surface preparation: degreasing and pre-etch; abrasion, fracture, cleaving; thermal desorption; ion etching; chemical reaction; gas exposure; evaporation; magnetron sputtering; knudsen cells; quartz crystal monitor
• Complementary optical probes of surfaces and optical techniques for extracting surface and interface information with a resolution of less than a single atomic layer; epioptics; polarized reflection techniques: reflection anisotropy spectroscopy, spectroscopic ellipsometry, Raman scattering, and briefly: optical second harmonic and sum-frequency generation.

Recommended reading:

• Modern Techniques of Surface Science, T.A. Delchar and D.P. Woodruff, (Cambridge Solid State Science Series, 1994, ISBN 0521414679)
• Vacuum Technology, A Roth, (North Holland, 1976, ISBN 0720403138)

And also:

• X-ray photoelectron spectroscopy : an introduction to principles and practices, Paul van der Heide (Wiley-Blackwell, 2011, ISBN 9781118062531)
• An introduction to synchrotron radiation : techniques and applications, Phil Willmott, (Wiley, 2011, ISBN 9780470745793)