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Secondary Navigation
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Interference Contrast Microscopy
Interference contrast microscopy uses polarised light to increase the contrast on transparent samples with topographical and optical density variations.
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Instrumentation
Leitz Laborlux 12 ME with standard Brightfield and Interferance contrast capabilities. Fitted with a Leica DFC420 Camera, PC controlled.
Software
Leica LAS Reticule; displays customised reticules on live and captured images.
Operation
magnification: 50X to 500X
recticule resolution: 2 microns
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| Sample projects click image for details |
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