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X-ray Diffraction system
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Overview
The school of physics operates a Bruker D8 Discover XRD system.
The system is equipped with a Cu K\alpha X-ray source, and Goebel mirror for a parallel beam. Multiple measurements and detector configurations can be selected, namely a fast low noise strip detector (LynxEye) for quick powder scans and a scintillation counter used for grazing incidence X-ray diffraction (GIXD) more suitable for thin, powder like films. The system is equipped with automated x, y, z, \phi and \chi drives making it suitable for multiple sample measurements or wafer mapping. A dedicated sample stage, including a knife edge driven by an accurate position stage (\micro m), can be used for X-ray reflection (XRR) measurements to measure the thickness of thin smooth layers (2-150 nm) or analyse multilayer samples.
The control PC has the Bruker programs for analysing all type measurements installed (EVA, Leptos, Topas, PDF database).
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| Please contact Dr. Karsten Fleischer Office: +353 1 8964637 Mobile: +353 85 1375684 Email: fleisck@tcd.ie |
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