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Reflection Anisotropic Spectroscopy
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| This system is operarted by the Surface and Interface Physics Group under Prof. John McGilp. Contact Niall McAlinden by email or at Extension 1310. |
Reflection anisotropy spectroscopy (RAS) measures the difference in reflectance of normal incidence, linearly polarized light, between two orthogonal directions in the surface plane [1,2].
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where  x and y are the complex reflection coefficients of light polarized in the x and y directions, respectively. The RAS signal for bulk anisotropic samples is directly related to the complex dielectric tensor components by
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Operational Range: 0.42 to 5 eV
schematic of the RAS system showing the primary components; xenon light source, calcite polarisers,
quartz photoelastic modulator (PEM), two photodiodes (InGaAs < 1.4 eV, Si above).
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References:
[1] D. E. Aspnes and A. A. Studna, Phys. Rev. Lett. 54(17), 1956–9 (1985).
[2] V. L. Berkovits, I.V. Makarenko, T. A. Minashvili, and V. I. Safarov, Solid State Commun. 56(5), 449–450 (1985). |
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