Jeol 2100

The Jeol 2100 Transmission Electron Microscope (TEM) can be used for a variety of imaging and analytical applications. The CMA uses a Jeol 2100 operating at 200kv with a Lanthanum Hexaborise emission source. Thin specimens are inserted, through an airlock system, into the high vacuum of the column. Then electrons are  accelerated down the column and pass through the specimen to form an image in the beam. A series of electromagnetic lenses controls and magnifies the image before it is visualised by striking a phosphor coated viewing  screen or ccd camera. A tilting stage allows the production of stereo images and the lattice structure of crystalline specimens may be measured by electron diffraction. The image can recorded digitally using a AMT digital camera.

Specimen preparation is extremely important and biological specimens require fixation to preserve their structure, followed by dehydration and finally  embedding in an epoxy resin. The resin embedded samples are then sectioned, using an ultra-microtome, to give a section thickness in the region of 70-90 nm. Bacteria and viruses may be viewed by placing them on a coated grid and using a negative staining technique.

Materials specimens such as powders, particulartes etc. may be examined by placing them directly on to coated grids while polymers may also be sectioned and observed. Metals, ceramics etc. require thinning by specialised equipment such as an ion beam mill or FIB, elctropolishing etc.

 Resolution :- 0.23nm (point), 0.14nm (lattice).

Accelerating Voltage Range :- 80Kv. - 200Kv.

Stage Tilt :- + or - 60 degrees.

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